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Kim, S., Kioseoglou, G., Huang, S., Kao, Y. H., Soo, Y. L., Zhu, X., Wang, K. L. (2005) Characterization of nanostructure in Si1−xGex epilayers using x-ray reflectivity and fluorescence techniques. Journal of Applied Physics, 98 (7). 74309pp. doi:10.1063/1.2073976

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of nanostructure in Si1−xGex epilayers using x-ray reflectivity and fluorescence techniques
JournalJournal of Applied Physics
AuthorsKim, S.Author
Kioseoglou, G.Author
Huang, S.Author
Kao, Y. H.Author
Soo, Y. L.Author
Zhu, X.Author
Wang, K. L.Author
Year2005 (October)Volume98
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.2073976Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5136396Long-form Identifiermindat:1:5:5136396:9
GUID0
Full ReferenceKim, S., Kioseoglou, G., Huang, S., Kao, Y. H., Soo, Y. L., Zhu, X., Wang, K. L. (2005) Characterization of nanostructure in Si1−xGex epilayers using x-ray reflectivity and fluorescence techniques. Journal of Applied Physics, 98 (7). 74309pp. doi:10.1063/1.2073976
Plain TextKim, S., Kioseoglou, G., Huang, S., Kao, Y. H., Soo, Y. L., Zhu, X., Wang, K. L. (2005) Characterization of nanostructure in Si1−xGex epilayers using x-ray reflectivity and fluorescence techniques. Journal of Applied Physics, 98 (7). 74309pp. doi:10.1063/1.2073976
In(2005, October) Journal of Applied Physics Vol. 98 (7) AIP Publishing

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Kim, S., Soo, Y. L., Kioseoglou, G., Kao, Y. H., Ramanathan, K., Deb, S. K. (2002) Compositional intermixing at CdS/Cu(In,Ga)Se[sub 2] rough interface studied by x-ray fluorescence. Journal of Applied Physics, 91 (10). 6416pp. doi:10.1063/1.1471388
Soo, Y. L., Kioseoglou, G., Kim, S., Chen, X., Luo, H., Kao, Y. H., Sasaki, Y., Liu, X., Furdyna, J. K. (2002) Studies of Mn/GaAs digital alloys using x-ray absorption fine structure and x-ray diffraction methods. Applied Physics Letters, 80 (15). 2654-2656 doi:10.1063/1.1467982
Kim, S., Soo, Y. L., Kioseoglou, G., Kao, Y. H., Compaan, A. D. (2004) Migration of Te atoms and structural changes in CdS/CdTe heterojuctions studied by x-ray scattering and fluorescence. Journal of Applied Physics, 96 (2). 1007-1012 doi:10.1063/1.1755852
Soo, Y. L., Kioseoglou, G., Huang, S., Kim, S., Kao, Y. H., Peng, Y. H., Cheng, H. H. (2001) “Inverted hut” structure of Si–Ge nanocrystals studied by extended x-ray absorption fine structure method. Applied Physics Letters, 78 (23). 3684-3686 doi:10.1063/1.1377311
Kioseoglou, G., Kim, S., Soo, Y. L., Chen, X., Luo, H., Kao, Y. H., Sasaki, Y., Liu, X., Furdyna, J. K. (2002) Investigation of nanoscale structure in digital layers of Mn/GaAs and MnGa/GaAs. Applied Physics Letters, 80 (7). 1150-1152 doi:10.1063/1.1448658
Soo, Y. L., Kioseoglou, G., Huang, S., Kim, S., Kao, Y. H., Takatani, Y., Haneda, S., Munekata, H. (2001) Local structure around Fe in the diluted magnetic semiconductorsGa1−xFexAsstudied by x-ray absorption fine structure. Physical Review B, 63 (19) doi:10.1103/physrevb.63.195209
Ming, Z. H., Krol, A., Soo, Y. L., Kao, Y. H., Park, J. S., Wang, K. L. (1993) Microscopic structure of interfaces inSi1−xGex/Si heterostructures and superlattices studied by x-ray scattering and fluorescence yield. Physical Review B, 47 (24) 16373-16381 doi:10.1103/physrevb.47.16373
Soo, Y. L., Huang, S., Kim, S., Kioseoglou, G., Kao, Y. H., Compaan, A. D., Grecu, D., Albin, D. (2000) Effects of heat treatment on diffusion of Cu atoms into CdTe single crystals. Applied Physics Letters, 76 (25). 3729-3731 doi:10.1063/1.126764
Ming, Z. H., Soo, Y. L., Huang, S., Kao, Y. H., Tsang, J. C., Iyer, S. S. (1994) Interfacial microstructures of ultrathin Ge layers on Si probed by x‐ray scattering and fluorescence yield. Applied Physics Letters, 65 (11). 1382-1384 doi:10.1063/1.113007
Soo, Y. L., Kioseoglou, G., Kim, S., Huang, S., Kao, Y. H., Kuwabara, S., Owa, S., Kondo, T., Munekata, H. (2001) Local structure and chemical valency of Mn impurities in wide-band-gap III–V magnetic alloy semiconductors Ga1−xMnxN. Applied Physics Letters, 79 (24). 3926-3928 doi:10.1063/1.1423406
Soo, Y. L., Kioseoglou, G., Huang, S., Kim, S., Kao, Y. H., Takatani, Y., Haneda, S., Munekata, H. (2001) Studies of impurities in magnetic semiconductors: an example of important XAFS applications. Journal of Synchrotron Radiation, 8 (2). 874-876 doi:10.1107/s0909049500016708
 
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