Zhou, Zhiyong, Steigerwald, Michael L., Friesner, Richard A., Brus, Louis, Hybertsen, Mark S. (2005) Dopant local bonding and electrical activity near Si(001)-oxide interfaces. Journal of Applied Physics, 98 (7). 76105pp. doi:10.1063/1.2071447
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Dopant local bonding and electrical activity near Si(001)-oxide interfaces | ||
| Journal | Journal of Applied Physics | ||
| Authors | Zhou, Zhiyong | Author | |
| Steigerwald, Michael L. | Author | ||
| Friesner, Richard A. | Author | ||
| Brus, Louis | Author | ||
| Hybertsen, Mark S. | Author | ||
| Year | 2005 (October) | Volume | 98 |
| Issue | 7 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.2071447Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5136358 | Long-form Identifier | mindat:1:5:5136358:9 |
| GUID | 0 | ||
| Full Reference | Zhou, Zhiyong, Steigerwald, Michael L., Friesner, Richard A., Brus, Louis, Hybertsen, Mark S. (2005) Dopant local bonding and electrical activity near Si(001)-oxide interfaces. Journal of Applied Physics, 98 (7). 76105pp. doi:10.1063/1.2071447 | ||
| Plain Text | Zhou, Zhiyong, Steigerwald, Michael L., Friesner, Richard A., Brus, Louis, Hybertsen, Mark S. (2005) Dopant local bonding and electrical activity near Si(001)-oxide interfaces. Journal of Applied Physics, 98 (7). 76105pp. doi:10.1063/1.2071447 | ||
| In | (2005, October) Journal of Applied Physics Vol. 98 (7) AIP Publishing | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
