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Grossmann, M., Lohse, O., Bolten, D., Boettger, U., Waser, R. (2002) The interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. II. Numerical simulation and verification. Journal of Applied Physics, 92 (5). 2688-2696 doi:10.1063/1.1498967

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Reference TypeJournal (article/letter/editorial)
TitleThe interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. II. Numerical simulation and verification
JournalJournal of Applied Physics
AuthorsGrossmann, M.Author
Lohse, O.Author
Bolten, D.Author
Boettger, U.Author
Waser, R.Author
Year2002 (September)Volume92
Issue5
PublisherAIP Publishing
DOIdoi:10.1063/1.1498967Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5116534Long-form Identifiermindat:1:5:5116534:9
GUID0
Full ReferenceGrossmann, M., Lohse, O., Bolten, D., Boettger, U., Waser, R. (2002) The interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. II. Numerical simulation and verification. Journal of Applied Physics, 92 (5). 2688-2696 doi:10.1063/1.1498967
Plain TextGrossmann, M., Lohse, O., Bolten, D., Boettger, U., Waser, R. (2002) The interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. II. Numerical simulation and verification. Journal of Applied Physics, 92 (5). 2688-2696 doi:10.1063/1.1498967
In(2002, September) Journal of Applied Physics Vol. 92 (5) AIP Publishing

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Grossmann, M., Lohse, O., Bolten, D., Boettger, U., Schneller, T., Waser, R. (2002) The interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. I. Dopant, illumination, and bias dependence. Journal of Applied Physics, 92 (5). 2680-2687 doi:10.1063/1.1498966
Grossmann, M., Lohse, O., Bolten, D., Boettger, U., Schneller, T., Waser, R. (2002) Interface-related decrease of the permittivity in PbZrxTi1−xO3 thin films. Applied Physics Letters, 80 (8). 1427-1429 doi:10.1063/1.1452783
Grossmann, M., Lohse, O., Bolten, D., Boettger, U., Waser, R., Hartner, W., Kastner, M., Schindler, G. (2000) Lifetime estimation due to imprint failure in ferroelectric SrBi2Ta2O9 thin films. Applied Physics Letters, 76 (3). 363-365 doi:10.1063/1.125755
Lohse, O., Grossmann, M., Boettger, U., Bolten, D., Waser, R. (2001) Relaxation mechanism of ferroelectric switching in Pb(Zr,Ti)O3 thin films. Journal of Applied Physics, 89 (4). 2332-2336 doi:10.1063/1.1331341
Grossmann, M., Bolten, D., Lohse, O., Boettger, U., Waser, R., Tiedke, S. (2000) Correlation between switching and fatigue in PbZr[sub 0.3]Ti[sub 0.7]O[sub 3] thin films. Applied Physics Letters, 77 (12). 1894pp. doi:10.1063/1.1290154
Bolten, D., Böttger, U., Schneller, T., Grossmann, M., Lohse, O., Waser, R. (2000) Reversible and irreversible processes in donor-doped Pb(Zr,Ti)O3. Applied Physics Letters, 77 (23). 3830-3832 doi:10.1063/1.1331353
Ellerkmann, U., Liedtke, R., Boettger, U., Waser, R. (2004) Interface-related thickness dependence of the tunability in BaSrTiO3 thin films. Applied Physics Letters, 85 (20). 4708-4710 doi:10.1063/1.1824173
Bolten, D., Böttger, U., Waser, R. (2003) Reversible and irreversible polarization processes in ferroelectric ceramics and thin films. Journal of Applied Physics, 93 (3). 1735-1742 doi:10.1063/1.1535748
Bolten, D., Böttger, U., Waser, R. (2003) Frequency and temperature dependence of the relative permittivity in ferroelectrics: Monte-Carlo simulation study. Journal of Applied Physics, 93 (5). 2890-2894 doi:10.1063/1.1544649
Yang, Pingxiong, Xu, Jianfeng, Ballato, John, Schwartz, Robert W., Carroll, David L. (2002) Optical limiting in SrBi2Ta2O9 and PbZrxTi1−xO3 ferroelectric thin films. Applied Physics Letters, 80 (18). 3394-3396 doi:10.1063/1.1477618
Moret, M. P., Devillers, M. A. C., Wörhoff, K., Larsen, P. K. (2002) Optical properties of PbTiO3, PbZrxTi1−xO3, and PbZrO3 films deposited by metalorganic chemical vapor on SrTiO3. Journal of Applied Physics, 92 (1). 468-474 doi:10.1063/1.1486048
 
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