An, B., Fukuyama, S., Yokogawa, K., Yoshimura, M. (2002) Evolution of Ar+-damaged graphite surface during annealing as investigated by scanning probe microscopy. Journal of Applied Physics, 92 (5). 2317-2322 doi:10.1063/1.1495892
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Evolution of Ar+-damaged graphite surface during annealing as investigated by scanning probe microscopy | ||
| Journal | Journal of Applied Physics | ||
| Authors | An, B. | Author | |
| Fukuyama, S. | Author | ||
| Yokogawa, K. | Author | ||
| Yoshimura, M. | Author | ||
| Year | 2002 (September) | Volume | 92 |
| Issue | 5 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.1495892Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5116409 | Long-form Identifier | mindat:1:5:5116409:4 |
| GUID | 0 | ||
| Full Reference | An, B., Fukuyama, S., Yokogawa, K., Yoshimura, M. (2002) Evolution of Ar+-damaged graphite surface during annealing as investigated by scanning probe microscopy. Journal of Applied Physics, 92 (5). 2317-2322 doi:10.1063/1.1495892 | ||
| Plain Text | An, B., Fukuyama, S., Yokogawa, K., Yoshimura, M. (2002) Evolution of Ar+-damaged graphite surface during annealing as investigated by scanning probe microscopy. Journal of Applied Physics, 92 (5). 2317-2322 doi:10.1063/1.1495892 | ||
| In | (2002, September) Journal of Applied Physics Vol. 92 (5) AIP Publishing | ||
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