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Lee, J. H., Lee, K. I., Lee, W. L., Shin, K.-H., Lee, J. S., Rhie, K., Lee, B. C. (2002) Temperature dependence of tunneling magnetoresistance: Double-barrier versus single-barrier junctions. Journal of Applied Physics, 91 (10). 7956pp. doi:10.1063/1.1452232

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Reference TypeJournal (article/letter/editorial)
TitleTemperature dependence of tunneling magnetoresistance: Double-barrier versus single-barrier junctions
JournalJournal of Applied Physics
AuthorsLee, J. H.Author
Lee, K. I.Author
Lee, W. L.Author
Shin, K.-H.Author
Lee, J. S.Author
Rhie, K.Author
Lee, B. C.Author
Year2002Volume91
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.1452232Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5111945Long-form Identifiermindat:1:5:5111945:6
GUID0
Full ReferenceLee, J. H., Lee, K. I., Lee, W. L., Shin, K.-H., Lee, J. S., Rhie, K., Lee, B. C. (2002) Temperature dependence of tunneling magnetoresistance: Double-barrier versus single-barrier junctions. Journal of Applied Physics, 91 (10). 7956pp. doi:10.1063/1.1452232
Plain TextLee, J. H., Lee, K. I., Lee, W. L., Shin, K.-H., Lee, J. S., Rhie, K., Lee, B. C. (2002) Temperature dependence of tunneling magnetoresistance: Double-barrier versus single-barrier junctions. Journal of Applied Physics, 91 (10). 7956pp. doi:10.1063/1.1452232
In(2002) Journal of Applied Physics Vol. 91 (10) AIP Publishing

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Lee, K. I., Lee, J. H., Lee, W. L., Shin, K. H., Sung, Y. B., Ha, J. G., Rhie, K., Lee, B. C. (2002) Temperature dependence of magnetoresistance for tunnel junctions with high-power plasma-oxidized barriers: Effects of annealing. Journal of Applied Physics, 91 (10). 7959pp. doi:10.1063/1.1452233
Park, S. Y., Lee, J. H., Shin, I. J., Hong, J. P., Shin, K-H., Rhie, K., Lee, B. C. (2004) Tunneling magnetoresistance of nano-scale magnetic tunnel junctions. physica status solidi (a), 201 (8). 1692-1695 doi:10.1002/pssa.200304678
Joo, Sungjung, Jung, K. Y., Jun, K. I., Kim, D. S., Shin, K. H., Hong, J. K., Lee, B. C., Rhie, K. (2014) Spin-filtering effect of thin Al2O3 barrier on tunneling magnetoresistance. Applied Physics Letters, 104 (15). 152407pp. doi:10.1063/1.4870812
Lee, K. I., Joo, S. J., Lee, J. H., Rhie, K., Kim, Tae-Suk, Lee, W. Y., Shin, K. H., Lee, B. C., LeClair, P., Lee, J.-S., Park, J.-H. (2007) Kondo Effect in Magnetic Tunnel Junctions. Physical Review Letters, 98 (10). doi:10.1103/physrevlett.98.107202
Lee, J.H., Jun, K.-I., Shin, K.-H., Park, S.Y., Hong, J.K., Rhie, K., Lee, B.C. (2005) Large magnetocurrents in double-barrier tunneling transistors. Journal of Magnetism and Magnetic Materials, 286. 138-141 doi:10.1016/j.jmmm.2004.09.017
Lee, Hyeon-Jun, Jeong, Se-Young, Cho, Chae Ryong, Lee, J. H., Joo, S. J., Shin, K. H., Lee, B. C., Kim, Tae-Suk, Park, J.-H., Kang, J.-S., Rhie, K. (2005) X-ray photoelectron spectroscopy study of magnetic tunnel junctions. Journal of Applied Physics, 97 (3). 33906pp. doi:10.1063/1.1836853
Lee, J.H., Chang, In-Woo, Byun, S.J., Rhie, K., Shin, Kyung-Ho, Lee, Kyung-Il, Ha, J.G., Lee, B.C. (2002) Temperature dependence of the tunneling magnetoresistance for tunnel junctions. Journal of Magnetism and Magnetic Materials, 240. 149-151 doi:10.1016/s0304-8853(01)00768-5
Lee, K. J., Kim, Y. S., Kim, E. S., Im, Y. H., Lee, K. M., Kim, J. W., Lee, B. K., Oh, H. S., Kim, K. Y., Park, N. Y., Lee, T. D. (2002) Recording physics of perpendicular recording with single layered medium and ring head. Journal of Applied Physics, 91 (10). 8700pp. doi:10.1063/1.1453358
Lee, K.I., Lee, J.H., Lee, W.Y., Shin, K.H., Ri, H.-C., Lee, B.C., Rhie, K. (2004) Quenching of tunneling magnetoresistance at low temperatures. Journal of Magnetism and Magnetic Materials, 272. doi:10.1016/j.jmmm.2003.12.282
Joo, Sungjung, Jung, K. Y., Lee, B. C., Kim, Tae-Suk, Shin, K. H., Jung, Myung-Hwa, Rho, K.-J., Park, J.-H., Hong, Jinki, Rhie, K. (2012) Effect of oxidizing the ferromagnetic electrode in magnetic tunnel junctions on tunneling magnetoresistance. Applied Physics Letters, 100 (17). 172406pp. doi:10.1063/1.4704557
Lee, J. H., Jeong, H. D., Kyung, H., Yoon, C. S., Kim, C. K., Park, B. G., Lee, T. D. (2002) Failure of exchange-biased low resistance magnetic tunneling junctions upon thermal treatment. Journal of Applied Physics, 91 (1). 217pp. doi:10.1063/1.1420770
 
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