Makhotkin, I. A., Louis, E., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., Seregin, A. Yu., Tereschenko, E. Yu., Yakunin, S. N., Bijkerk, F. (2011) Determination of the density of ultrathin La films in La/B4C layered structures using X-ray standing waves. physica status solidi (a), 208 (11). 2597-2600 doi:10.1002/pssa.201184256

See Also

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	Nyabero, S. L., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., Bijkerk, F. (2012) Thermally induced interface chemistry in Mo/B4C/Si/B4C multilayered films. Journal of Applied Physics, 112 (5). 54317pp. doi:10.1063/1.4751029
	de Rooij-Lohmann, V. I. T. A., Veldhuizen, L. W., Zoethout, E., Yakshin, A. E., van de Kruijs, R. W. E., Thijsse, B. J., Gorgoi, M., Schäfers, F., Bijkerk, F. (2010) Chemical interaction of B4C, B, and C with Mo/Si layered structures. Journal of Applied Physics, 108 (9). 94314pp. doi:10.1063/1.3503521
	Nyabero, S. L., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., von Blanckenhagen, G., Bosgra, J., Loch, R. A., Bijkerk, F. (2013) Interlayer growth in Mo/B4C multilayered structures upon thermal annealing. Journal of Applied Physics, 113 (14). 144310pp. doi:10.1063/1.4800910
	Zameshin, Andrey, Makhotkin, Igor A., Yakunin, Sergey N., van de Kruijs, Robbert W. E., Yakshin, Andrey E., Bijkerk, Fred (2016) Reconstruction of interfaces of periodic multilayers from X-ray reflectivity using a free-form approach. Journal of Applied Crystallography, 49 (4). 1300-1307 doi:10.1107/s160057671601044x
	de Rooij-Lohmann, V. I. T. A., Yakshin, A. E., van de Kruijs, R. W. E., Zoethout, E., Kleyn, A. W., Keim, E. G., Gorgoi, M., Schäfers, F., Brongersma, H. H., Bijkerk, F. (2010) Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems. Journal of Applied Physics, 108 (1). 14314pp. doi:10.1063/1.3460107
	Coloma Ribera, R., van de Kruijs, R. W. E., Kokke, S., Zoethout, E., Yakshin, A. E., Bijkerk, F. (2014) Surface and sub-surface thermal oxidation of thin ruthenium films. Applied Physics Letters, 105 (13). 131601pp. doi:10.1063/1.4896993
	Nikolaev, K. V., Soltwisch, V., Hönicke, P., Scholze, F., de la Rie, J., Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., Bijkerk, F. (2020) A semi-analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescence. Journal of Synchrotron Radiation, 27 (2). 386-395 doi:10.1107/s1600577519016345
	Bruijn, S., van de Kruijs, R. W. E, Yakshin, A. E., Bijkerk, F. (2012) Ion assisted growth of B4C diffusion barrier layers in Mo/Si multilayered structures. Journal of Applied Physics, 111 (6). 64303pp. doi:10.1063/1.3693992
	Nikolaev, K. V., Yakunin, S. N., Makhotkin, I. A., Rie, J. de la, Medvedev, R. V., Rogachev, A. V., Trunckin, I. N., Vasiliev, A. L., Hendrikx, C. P., Gateshki, M., Kruijs, R. W. E. van de, Bijkerk, F. (2019) Grazing-incidence small-angle X-ray scattering study of correlated lateral density fluctuations in W/Si multilayers. Acta Crystallographica Section A Foundations and Advances, 75 (2). 342-351 doi:10.1107/s2053273318017382
	Medvedev, V. V., Yang, J., Schmidt, A. J., Yakshin, A. E., van de Kruijs, R. W. E., Zoethout, E., Bijkerk, F. (2015) Anisotropy of heat conduction in Mo/Si multilayers. Journal of Applied Physics, 118 (8). 85101pp. doi:10.1063/1.4928958