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Kochelab, V. V., Molodkin, V. B., Olikhovskii, S. I., Osinovskii, M. E. (1988) The thickness dependence of the X-ray diffuse scattering intensity for crystals with microdefects at laue-case diffraction. physica status solidi (a), 108 (1). 67-79 doi:10.1002/pssa.2211080103

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Reference TypeJournal (article/letter/editorial)
TitleThe thickness dependence of the X-ray diffuse scattering intensity for crystals with microdefects at laue-case diffraction
Journalphysica status solidi (a)
AuthorsKochelab, V. V.Author
Molodkin, V. B.Author
Olikhovskii, S. I.Author
Osinovskii, M. E.Author
Year1988 (July 16)Volume108
Issue1
PublisherWiley
DOIdoi:10.1002/pssa.2211080103Search in ResearchGate
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Mindat Ref. ID5072090Long-form Identifiermindat:1:5:5072090:9
GUID0
Full ReferenceKochelab, V. V., Molodkin, V. B., Olikhovskii, S. I., Osinovskii, M. E. (1988) The thickness dependence of the X-ray diffuse scattering intensity for crystals with microdefects at laue-case diffraction. physica status solidi (a), 108 (1). 67-79 doi:10.1002/pssa.2211080103
Plain TextKochelab, V. V., Molodkin, V. B., Olikhovskii, S. I., Osinovskii, M. E. (1988) The thickness dependence of the X-ray diffuse scattering intensity for crystals with microdefects at laue-case diffraction. physica status solidi (a), 108 (1). 67-79 doi:10.1002/pssa.2211080103
In(1988, July) physica status solidi (a) Vol. 108 (1) Wiley

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Molodkin, V. B., Olikhovskii, S. I., Kislovskii, E. N., Fodchuk, I. M., Skakunova, E. S., Pervak, E. V., Molodkin, V. V. (2007) Dynamical theory of X-ray diffraction by multilayered structures with microdefects. physica status solidi (a), 204 (8). 2606-2612 doi:10.1002/pssa.200675686
Molodkin, V. B., Olikhovskii, S. I., Kostyuk, A. N. (1994) Dynamical theory of X-ray diffraction by elastically bent crystals with microdefects. II. Diffraction intensity. physica status solidi (b), 183 (1). 59-72 doi:10.1002/pssb.2221830103
Molodkin, V. B., Olikhovskii, S. I., Len, E. G., Sheludchenko, B. V., Lizunova, S. V., Kyslovs'kyy, Ye. M., Vladimirova, T. P., Kochelab, E. V., Reshetnyk, O. V., Dovganyuk, V. V., Fodchuk, I. M., Lytvynchuk, T. V., Klad'ko, V. P., Świątek, Z. (2011) X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation. physica status solidi (a), 208 (11). 2552-2557 doi:10.1002/pssa.201184253
Kostyuk, A. N., Molodkin, V. B., Olikhovskii, S. I. (1993) Dynamical Theory of X-Ray Diffraction by Elastically Bent Crystals with Microdefects I. Basic Equations. physica status solidi (b), 178 (1). 45-57 doi:10.1002/pssb.2221780104
Molodkin, V. B., Olikhovskii, S. I., Osinovskii, M. E., Gureev, A. N., Datsenko, L. I., Nizkova, A. I., Zhuravlev, B. F. (1985) The integrated intensities of the Laue-diffracted X-rays for monocrystals containing macroscopically homogeneously distributed defects. physica status solidi (a), 87 (2). 597-608 doi:10.1002/pssa.2210870223
Olikhovskii, S. I., Molodkin, V. B., Skakunova, E. S., Kislovskii, E. N., Fodchuk, I. M. (2009) X-ray diffuse scattering effects from Coulomb-type defects in multilayered structures. physica status solidi (a), 206 (8). 1790-1794 doi:10.1002/pssa.200881590
Kyslovskyy, Ye. M., Vladimirova, T. P., Olikhovskii, S. I., Molodkin, V. B., Kochelab, E. V., Seredenko, R. F. (2007) Evolution of the microdefect structure in silicon on isothermal annealing as determined by X-ray diffractometry. physica status solidi (a), 204 (8). 2591-2597 doi:10.1002/pssa.200675680
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Shpak, A. P., Molodkin, V. B., Olikhovskii, S. I., Kyslovskyy, Ye. M., Reshetnyk, O. V., Vladimirova, T. P., Len, E. G., Nizkova, A. I., Venger, V. M., Dmitriev, S. V. (2007) Combined double- and triple-crystal X-ray diffractometry with account for real defect structures in all crystals of X-ray optical schemes. physica status solidi (a), 204 (8). 2651-2656 doi:10.1002/pssa.200675700
 
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