Herrington, Charles R. (1985) Quantitative EDS and WDS X-ray microanalysis of semiconductor materials: Principles and comparisons. Journal of Electron Microscopy Technique, 2 (5). 471-479 doi:10.1002/jemt.1060020509
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Quantitative EDS and WDS X-ray microanalysis of semiconductor materials: Principles and comparisons | ||
| Journal | Journal of Electron Microscopy Technique | ||
| Authors | Herrington, Charles R. | Author | |
| Year | 1985 | Volume | 2 |
| Page(s) | 471-479 | Issue | 5 |
| Publisher | Wiley | ||
| DOI | doi:10.1002/jemt.1060020509Search in ResearchGate | ||
| Mindat Ref. ID | 4988238 | Long-form Identifier | mindat:1:5:4988238:2 |
| GUID | d2dd7076-cbd2-45bc-87ae-46436fa63d4d | ||
| Full Reference | Herrington, Charles R. (1985) Quantitative EDS and WDS X-ray microanalysis of semiconductor materials: Principles and comparisons. Journal of Electron Microscopy Technique, 2 (5). 471-479 doi:10.1002/jemt.1060020509 | ||
| Plain Text | Herrington, Charles R. (1985) Quantitative EDS and WDS X-ray microanalysis of semiconductor materials: Principles and comparisons. Journal of Electron Microscopy Technique, 2 (5). 471-479 doi:10.1002/jemt.1060020509 | ||
| In | (1985) Journal of Electron Microscopy Technique Vol. 2 (5) Wiley | ||
References Listed
These are the references the publisher has listed as being connected to the article. Please check the article itself for the full list of references which may differ. Not all references are currently linkable within the Digital Library.
| and (1984) Quantitative electron-probe microanalysis of carbon in binary carbides. In and (eds): Microbeam Analysis/1984. San Francisco Press, Inc., pp. 291-294. | |
| (1983) Sandia TASK-83. An electron microprobe automation system. Sandia National Laboratory, Albuquerque, NM 87185. | |
| (1977) A comparison of minimum detection limits using energy and wavelength dispersive spectrometers. In (ed): Scanning Electron Microscopy/1977, Vol. I. Chicago: SEM Inc., AMF O'Hare, pp. 281-288. | |
| Not Yet Imported: - book : 10.1007/978-1-4613-3273-2 If you would like this item imported into the Digital Library, please contact us quoting Book ID 9781461332756 | |
| Not Yet Imported: - book : 10.1007/978-1-4613-3273-2 If you would like this item imported into the Digital Library, please contact us quoting Book ID 9781461332756 | |
| Not Yet Imported: - book : 10.1007/978-1-4613-3273-2 If you would like this item imported into the Digital Library, please contact us quoting Book ID 9781461332756 | |
| Not Yet Imported: Scanning Electron Microscopy and X-Ray Microanalysis - book-chapter : 10.1007/978-1-4613-3273-2_7 If you would like this item imported into the Digital Library, please contact us quoting Book ID 9781461332756 | |
| Not Yet Imported: - book : 10.1007/978-1-4613-3273-2 If you would like this item imported into the Digital Library, please contact us quoting Book ID 9781461332756 | |
| Not Yet Imported: - book : 10.1007/978-1-4613-3273-2 If you would like this item imported into the Digital Library, please contact us quoting Book ID 9781461332756 | |
| Not Yet Imported: Scanning Electron Microscopy and X-Ray Microanalysis - book-chapter : 10.1007/978-1-4613-3273-2_5 If you would like this item imported into the Digital Library, please contact us quoting Book ID 9781461332756 | |
| (1981a) Analysis with inclined electron beam. In: Electron Beam X-ray Microanalysis. New York: Van Nostrand Reinhold Company, pp. 298-302. | |
| (1981b) The determination of elements of low atomic number. In: Electron Beam X-ray Microanalysis. New York: Van Nostrand Reinhold Company, pp. 375-380. | |
| (1981c) The limit of detection. In: Electron Beam X-ray Microanalysis. New York: Van Nostrand Reinhold Company, pp. 193-199. | |
| (1981d) The physics of X-rays. In: Electron Beam X-ray Microanalysis. New York: Van Nostrand Reinhold Company, pp. 59-96. | |
| (1981e) The practice of quantitative electron probe microanalysis. In: Electron Beam X-ray Microanalysis. New York: Van Nostrand Reinhold Company, pp. 339-413. | |
| (1981f) Theory of quantitative electron probe microanalysis: primary emission. In: Electron Beam X-ray Microanalysis. New York: Van Nostrand Reinhold Company, pp. 219-254. | |
| (1981g) X-ray spectrometry. In: Electron Beam X-ray Microanalysis. New York: Van Nostrand Reinhold Company, pp. 99-153. | |
| and (1982) Low energy X-ray interation coefficients: photoabsorption, scattering, and reflection. In: Atomic Data and Nuclear Data Tables, 27. pp. 1-144. | |
| and (1979a) Detection sensitivity. In: Microanalysis and Scanning Electron Microscopy. and (eds): Les Editions de Physique, pp. 306. | |
| and (1979b) Practical quantitative analysis of bulk specimens. In F. Maurice, L. Meny, and R. Tixier (eds): Microanalysis and Scanning Electron Microscopy Les Editions de Physique, pp. 281-308. | |
| (1981) Least-squares fit with digital filter. In and (eds): NBS Special Publication 604, Energy Dispersive X-ray Spectrometry, June 1981. pp. 273-296. | |
| (1979) X-ray emission. In and (eds): Microanalysis and Scanning Electron Microscopy. Les Editions de Physique, pp. 169-214. | |
| and (1976) Trace element analysis using X-ray excitation with an energy dispersive spectrometer on a scanning electron microscope. In (ed): Scanning Electron Microscopy/1976, Part I. Chicago: SEM Inc., AMF O'Hare, pp. 171-178. | |
| (1981) Properties and applications of windowless Si(Li) detectors. In bury, and (eds): NBS Special Publication 604, Energy Dispersive X-ray Spectrometry, June 1981. pp. 97-126. | |
| and (1984) Use of a Monte Carlo electron trajectory simulation for quantitative analysis of thick films in the electronprobe microanalyzer. In and (eds): Microbeam Analysis/1984. San Francisco Press, Inc., pp. 198-200. | |
| (1975a) Lithium drifted silicon detectors. In: Electron Microprobe Analysis. Cambridge University press, pp. 132-152. | |
| (1975b) X-ray diffraction spectrometers. In: Electron Microprobe Analysis. Cambridge University Press, pp. 72-93. | |
| (1977) Procedures for quantitative ultralight element energy dispersive X-ray analysis. In (ed): Scanning Electron Microscopy/1977, Vol. I. Chicago: SEM Inc., AMF O'Hare, pp. 289-296. | |
| and (1982) Microanalysis of candidate thin and thick film photovoltaic materials. In (ed): Scanning Electron Microscopy/1982, Vol. III. Chicago: SEM Inc., AMF O'Hare, pp. 1077-1082. | |
| (1979a) X-ray spectrometry. In and (eds): Microanalysis and Scanning Electron Microscopy. Les Editions de Physique, pp. 215-267. | |
| (1979b) X-ray spectrometry. In and (eds): Microanalysis and Scanning Electron Microscopy. Les Editions de Physique pp. 231, 243. | |
| (1984) NS-885 Super ML Operation and Program Description. Middleton, WI: Tracor Northern, Inc. | |
| and (1976) A simple analytical method for thin film analysis with massive pure element standards. In (ed): Scanning Electron Microscopy/1976, Part I. Chicago: SEM Inc., AMF O'Hare, pp. 151-162. |
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