(1993, December) Journal of Microscopy Vol. 172 (3) Wiley

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Reference Type	Journal (issue)
Journal	Journal of Microscopy
Year	1993 (December)	Volume	172
Issue	< 3
Publisher	Wiley
Mindat Ref. ID	4924697	Long-form Identifier	mindat:1:5:4924697:9
GUID	0
Full Reference	(1993, December) Journal of Microscopy Vol. 172 (3) Wiley
Plain Text	(1993, December) Journal of Microscopy Vol. 172 (3) Wiley
In	(1993) Journal of Microscopy Vol. 172. Wiley

Contains

	*(1993) Journal of Microscopy, 172 (3). Wiley. doi:10.1111/jmi.1993.172.issue-3*
	*Echlin, Patrick, Mattfeldt, Torsten (1993) Editorial. Journal of Microscopy, 172 (3). 187 doi:10.1111/j.1365-2818.1993.tb03411.x*
	HORIKAWA, Y., NAGAI, K., MOCHIMARU, S., IKETAKI, Y. (1993) A compact Schwarzschild soft X-ray microscope with a laser-produced plasma source. Journal of Microscopy, 172 (3). 189-194 doi:10.1111/j.1365-2818.1993.tb03412.x
	ENSIKAT, H. J., BARTHLOTT, W. (1993) Liquid substitution: A versatile procedure for SEM specimen preparation of biological materials without drying or coating. Journal of Microscopy, 172 (3). 195-203 doi:10.1111/j.1365-2818.1993.tb03413.x
	ZABAL, M. M. Z., CZARNOTA, G. J., BAZETT-JONES, D. P., OTTENSMEYER, F. P. (1993) Conformational characterization of nucleosomes by principal component analysis of their electron micrographs. Journal of Microscopy, 172 (3). 205-214 doi:10.1111/j.1365-2818.1993.tb03414.x
	WILKINS, M. J., DAVIES, M. C., JACKSON, D. E., ROBERTS, C. J., TENDLER, S. J. B. (1993) An investigation of substrate and sample preparation effects on scanning tunnelling microscopy studies on xanthan gum. Journal of Microscopy, 172 (3). 215-221 doi:10.1111/j.1365-2818.1993.tb03415.x
	*ANGUIANO, E., PANCORBO, M., AGUILAR, M. (1993) Fractal characterization by frequency analysis. I. Surfaces. Journal of Microscopy, 172 (3). 223-232 doi:10.1111/j.1365-2818.1993.tb03416.x*
	*AGUILAR, M., ANGUIANO, E., PANCORBO, M. (1993) Fractal characterization by frequency analysis. II. A new method. Journal of Microscopy, 172 (3). 233-238 doi:10.1111/j.1365-2818.1993.tb03417.x*
	*RUSS, J. C. (1993) Effects of noise and anisotropy on the determination of fractal dimensions. Journal of Microscopy, 172 (3). 239-248 doi:10.1111/j.1365-2818.1993.tb03418.x*
	THIOULOUSE, J., ROYET, J. P., PLOYE, H., HOULLIER, F. (1993) Evaluation of the precision of systematic sampling: Nugget effect and covariogram modelling. Journal of Microscopy, 172 (3). 249-256 doi:10.1111/j.1365-2818.1993.tb03419.x
	MOLCHANOV, I., STOYAN, D., FYODOROV, K. (1993) Directional analysis of planar fibre networks: Application to cardboard microstructure. Journal of Microscopy, 172 (3). 257-261 doi:10.1111/j.1365-2818.1993.tb03420.x
	*STARKEY, J., SAMANTARAY, A. K. (1993) Edge detection in petrographic images. Journal of Microscopy, 172 (3). 263-266 doi:10.1111/j.1365-2818.1993.tb03421.x*
	*(1993) Book Reviews. Journal of Microscopy, 172 (3). 267-268 doi:10.1111/j.1365-2818.1993.tb03422.x*

	*(1993, October) Journal of Microscopy* Vol. 172 (1) Wiley**
	*(1993, November) Journal of Microscopy* Vol. 172 (2) Wiley**
	*(1993, December) Microscopy Research and Technique* Vol. 26 (5) Wiley**
	*(1993, December) Microscopy Research and Technique* Vol. 26 (6) Wiley**
	*(1988, December) Journal of Microscopy* Vol. 152 (3) Wiley**
	*(1989, December) Journal of Microscopy* Vol. 156 (3) Wiley**
	*(1990, December) Journal of Microscopy* Vol. 160 (3) Wiley**
	*(1991, December) Journal of Microscopy* Vol. 164 (3) Wiley**
	*(1992, December) Journal of Microscopy* Vol. 168 (3) Wiley**
	*(1994, December) Journal of Microscopy* Vol. 176 (3) Wiley**
	*(1995, December) Journal of Microscopy* Vol. 180 (3) Wiley**

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(1993, December) Journal of Microscopy Vol. 172 (3) Wiley

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