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Hartshorne, Matthew I., Isheim, Dieter, Seidman, David N., Taheri, Mitra L. (2014) Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale features. Ultramicroscopy, 147. 25-32 doi:10.1016/j.ultramic.2014.05.005

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Reference TypeJournal (article/letter/editorial)
TitleSpecimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale features
JournalUltramicroscopy
AuthorsHartshorne, Matthew I.Author
Isheim, DieterAuthor
Seidman, David N.Author
Taheri, Mitra L.Author
Year2014 (December)Volume147
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2014.05.005Search in ResearchGate
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Mindat Ref. ID4909100Long-form Identifiermindat:1:5:4909100:5
GUID0
Full ReferenceHartshorne, Matthew I., Isheim, Dieter, Seidman, David N., Taheri, Mitra L. (2014) Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale features. Ultramicroscopy, 147. 25-32 doi:10.1016/j.ultramic.2014.05.005
Plain TextHartshorne, Matthew I., Isheim, Dieter, Seidman, David N., Taheri, Mitra L. (2014) Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale features. Ultramicroscopy, 147. 25-32 doi:10.1016/j.ultramic.2014.05.005
In(2014) Ultramicroscopy Vol. 147. Elsevier BV

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Baik, Sung-Il, Isheim, Dieter, Seidman, David N. (2018) Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses. Ultramicroscopy, 184. 284-292 doi:10.1016/j.ultramic.2017.10.007
Rout, Surya S., Heck, Philipp R., Isheim, Dieter, Stephan, Thomas, Davis, Andrew M., Seidman, David N. (2015) Correlative Transmission Electron Microscopy and Atom-Probe Tomography of an Iron Meteorite. Microscopy and Microanalysis, 21. 1313-1314 doi:10.1017/s1431927615007357
Hartshorne, Matthew, Leff, Asher, Vetterick, Gregory, Hopkins, Emily M, Taheri, Mitra L (2023) Grain Boundary Plane Measurement Using Transmission Electron Microscopy Automated Crystallographic Orientation Mapping for Atom Probe Tomography Specimens. Microscopy and Microanalysis, 29 (3) 1018-1025 doi:10.1093/micmic/ozad022
White, N., Eder, K., Byrnes, J., Cairney, J.M., McCarroll, I.E. (2021) Laser ablation sample preparation for atom probe tomography and transmission electron microscopy. Ultramicroscopy, 220. 113161pp. doi:10.1016/j.ultramic.2020.113161
Lewis, J. B., Isheim, D., Floss, C., Daulton, T. L., Seidman, D. N. (2016) Correlated Atom-Probe Tomography and Transmission Electron Microscopy of Meteoritic Nanodiamonds. Microscopy and Microanalysis, 22. 654-655 doi:10.1017/s1431927616004128
Mukherjee, Samik, Isheim, Dieter, Seidman, David N., Moutanabbir, Oussama (2016) Mapping Isotopes in Nanoscale and Quantum Materials Using Atom Probe Tomography. Microscopy and Microanalysis, 22. 652-653 doi:10.1017/s1431927616004116
Diercks, David R., Gorman, Brian P. (2018) Self-consistent atom probe tomography reconstructions utilizing electron microscopy. Ultramicroscopy, 195. 32-46 doi:10.1016/j.ultramic.2018.08.019
Rout, Surya S., Heck, Philipp R., Zaluzec, Nestor J., Isheim, Dieter, Miller, Dean J., Seidman, David N. (2018) Adhesive-Based Atom Probe Sample Preparation. Microscopy Today, 26 (2). 24-31 doi:10.1017/s1551929518000238
Herbig, M., Choi, P., Raabe, D. (2015) Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography. Ultramicroscopy, 153. 32-39 doi:10.1016/j.ultramic.2015.02.003
Koelling, Sebastian, Assali, Simone, Nadal, Guillaume, Isheim, Dieter, Seidman, David N., Moutanabbir, Oussama (2024) Tracking of atomic planes in atom probe tomography. Journal of Applied Physics, 136 (24). doi:10.1063/5.0226890
 
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