Bourret, A. (1982) Present limits of high resolution electron microscopy in the context of materials science. Ultramicroscopy, 9 (4). 404-405 doi:10.1016/0304-3991(82)90121-8

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Reference Type	Journal (article/letter/editorial)
Title	Present limits of high resolution electron microscopy in the context of materials science
Journal	Ultramicroscopy
Authors	Bourret, A.		Author
Year	1982 (January)	Volume	9
Issue	4
Publisher	Elsevier BV
DOI	doi:10.1016/0304-3991(82)90121-8Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	4890636	Long-form Identifier	mindat:1:5:4890636:6
GUID	0
Full Reference	Bourret, A. (1982) Present limits of high resolution electron microscopy in the context of materials science. Ultramicroscopy, 9 (4). 404-405 doi:10.1016/0304-3991(82)90121-8
Plain Text	Bourret, A. (1982) Present limits of high resolution electron microscopy in the context of materials science. Ultramicroscopy, 9 (4). 404-405 doi:10.1016/0304-3991(82)90121-8
In	(1982, January) Ultramicroscopy Vol. 9 (4) Elsevier BV

	*Carpenter, R.W. (1982) High resolution analytical electron microscopy. Ultramicroscopy, 8 (1). 79-93 doi:10.1016/0304-3991(82)90278-9*
	*Bourret, A. (1982) Core structure of dislocations and grain boundaries. Ultramicroscopy, 9 (4). 405-406 doi:10.1016/0304-3991(82)90122-x*
	*Ponce, Fernando A. (1982) Imaging of interfaces in semiconductor materials using high resolution transmission electron microscopy. Ultramicroscopy, 9 (3). 215-219 doi:10.1016/0304-3991(82)90202-9*
	*Kettunen, PenttiO. (1982) Electron microscopy in materials. Ultramicroscopy, 9 (4). 393pp. doi:10.1016/0304-3991(82)90103-6*
	*Takayanagi, Kunio (1982) High resolution surface study by In-situ UHV transmission electron microscopy. Ultramicroscopy, 8 (1). 145-161 doi:10.1016/0304-3991(82)90284-4*
	Ylä-Jääski, J., Nissen, H.-U. (1982) Superstructures in mullite () studied by high resolution electron microscopy and electron diffraction. Ultramicroscopy, 9 (4). 398pp. doi:10.1016/0304-3991(82)90112-7
	*Eyring, LeRoy (1982) The role of high-resolution electron microscopy in the development of solid state chemistry. Ultramicroscopy, 8 (1). 39-58 doi:10.1016/0304-3991(82)90275-3*
	*Baumeister, W. (1982) Towards higher resolution in biomolecular electron microscopy. Ultramicroscopy, 9 (1). 151-158 doi:10.1016/0304-3991(82)90237-6*
	*Broers, A.N. (1982) Resolution in surface scanning electron microscopy of bulk samples. Ultramicroscopy, 8 (1). 137-144 doi:10.1016/0304-3991(82)90283-2*
	Boudet, A., Kubin, L.P. (1982) The limitations to resolution in the observation of radiation-sensitive specimens by electron microscopy. Ultramicroscopy, 8 (4). 409-416 doi:10.1016/0304-3991(82)90064-x
	*Dubochet, J. (1982) Electron microscopy at 4K. Ultramicroscopy, 9 (4). 414pp. doi:10.1016/0304-3991(82)90138-3*

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Bourret, A. (1982) Present limits of high resolution electron microscopy in the context of materials science. Ultramicroscopy, 9 (4). 404-405 doi:10.1016/0304-3991(82)90121-8

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