Oral, A., Grimble, R. A., Özer, H. Ö., Pethica, J. B. (2003) High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy. Review of Scientific Instruments, 74 (8). 3656-3663 doi:10.1063/1.1593786

See Also

These are possibly similar items as determined by title/reference text matching only.

	Oral, Ahmet, Grimble, Ralph A., Özer, H. Özgür, Hoffmann, Peter M., Pethica, John B. (2001) Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy. Applied Physics Letters, 79 (12). 1915-1917 doi:10.1063/1.1389785
	Schrey, F. F., Chaban, E. E., Matthews, M. J., Hsu, J. W. P. (2003) A microscope for imaging, spectroscopy, and lithography at the nanometer scale: Combination of a two-photon laser scanning microscope and an atomic force microscope. Review of Scientific Instruments, 74 (3). 1211-1216 doi:10.1063/1.1535234
	Özer, H.Özgür, Atabak, Mehrdad, Ellialtıoğlu, Recai M., Oral, Ahmet (2002) Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2×1) with small oscillation amplitudes. Applied Surface Science, 188. 301-305 doi:10.1016/s0169-4332(01)00942-4
	Suganuma, Yoshinori, Dhirani, Al-Amin (2003) A hybrid scanning tunneling–atomic force microscope operable in air. Review of Scientific Instruments, 74 (10). 4373-4377 doi:10.1063/1.1610784
	Pürckhauer, Korbinian, Maier, Simon, Merkel, Anja, Kirpal, Dominik, Giessibl, Franz J. (2020) Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions. Review of Scientific Instruments, 91 (8) 83701pp. doi:10.1063/5.0013921
	Albers, Boris J., Liebmann, Marcus, Schwendemann, Todd C., Baykara, Mehmet Z., Heyde, Markus, Salmeron, Miquel, Altman, Eric I., Schwarz, Udo D. (2008) Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy. Review of Scientific Instruments, 79 (3). 33704pp. doi:10.1063/1.2842631
	Çelik, Ümit, Karcı, Özgür, Uysallı, Yiğit, Özer, H. Özgür, Oral, Ahmet (2017) Radiation pressure excitation of a low temperature atomic force/magnetic force microscope for imaging in 4-300 K temperature range. Review of Scientific Instruments, 88 (1). 13705pp. doi:10.1063/1.4973819
	Karcı, Özgür, Dede, Münir, Oral, Ahmet (2014) Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution. Review of Scientific Instruments, 85 (10). 103705pp. doi:10.1063/1.4897147
	Morita, Seizo, Sugawara, Yasuhiro, Fukano, Yoshinobu (1993) Atomic Force Microscope Combined with Scanning Tunneling Microscope [AFM/STM]. Japanese Journal of Applied Physics, 32. 2983-2988 doi:10.1143/jjap.32.2983
	Peronio, Angelo, Okabayashi, Norio, Griesbeck, Florian, Giessibl, Franz (2019) Radio frequency filter for an enhanced resolution of inelastic electron tunneling spectroscopy in a combined scanning tunneling- and atomic force microscope. Review of Scientific Instruments, 90 (12). 123104pp. doi:10.1063/1.5119888
	Sugawara, Yasuhiro, Ishizaka, Tatsuya, Morita, Seizo (1990) Simultaneous Imaging of a Graphite Surface with Atomic Force/Scanning Tunneling Microscope (AFM/STM) Japanese Journal of Applied Physics, 29. 1539-1543 doi:10.1143/jjap.29.1539