Martin, J.L., Kubin, L.P. (1978) Discussion on the limitations of “in situ” deformation experiments in a high voltage electron microscope. Ultramicroscopy, 3. 215-226 doi:10.1016/s0304-3991(78)80028-x

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Reference Type	Journal (article/letter/editorial)
Title	Discussion on the limitations of “in situ” deformation experiments in a high voltage electron microscope
Journal	Ultramicroscopy
Authors	Martin, J.L.		Author
Authors	Kubin, L.P.		Author
Year	1978 (January)	Volume	3
Publisher	Elsevier BV
DOI	doi:10.1016/s0304-3991(78)80028-xSearch in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	4889231	Long-form Identifier	mindat:1:5:4889231:9
GUID	0
Full Reference	Martin, J.L., Kubin, L.P. (1978) Discussion on the limitations of “in situ” deformation experiments in a high voltage electron microscope. Ultramicroscopy, 3. 215-226 doi:10.1016/s0304-3991(78)80028-x
Plain Text	Martin, J.L., Kubin, L.P. (1978) Discussion on the limitations of “in situ” deformation experiments in a high voltage electron microscope. Ultramicroscopy, 3. 215-226 doi:10.1016/s0304-3991(78)80028-x
In	(1978) Ultramicroscopy Vol. 3. Elsevier BV

	*Bhattacharya, D.K., Gupta, N.N. Das (1978) Electron scattering in high voltage electron microscopy. Ultramicroscopy, 3. 29-37 doi:10.1016/s0304-3991(78)80004-7*
	*(1978) Experimental limitations session summary. Ultramicroscopy, 3. 387-389 doi:10.1016/s0304-3991(78)80059-x*
	Boudet, A., Kubin, L.P. (1982) The limitations to resolution in the observation of radiation-sensitive specimens by electron microscopy. Ultramicroscopy, 8 (4). 409-416 doi:10.1016/0304-3991(82)90064-x
	*Egerton, R.F. (1978) A simple electron spectrometer for energy analysis in the transmission microscope. Ultramicroscopy, 3. 39-47 doi:10.1016/s0304-3991(78)80005-9*
	*(1978) Discussion. Ultramicroscopy, 3. 445-447 doi:10.1016/s0304-3991(78)80070-9*
	*Krakow, William (1978) Applications of electronically controlled illumination in the conventional transmission electron microscope. Ultramicroscopy, 3. 291-301 doi:10.1016/s0304-3991(78)80039-4*
	Messerschmidt, U., Bartsch, M. (1994) High-temperature straining stage for in situ experiments in the high-voltage electron microscope. Ultramicroscopy, 56 (1). 163-171 doi:10.1016/0304-3991(94)90155-4
	*Núñez-Durán, Harol, Peón, Jörge (1978) A simple device to detect vibrations in the electron microscope laboratory. Ultramicroscopy, 3. 253pp. doi:10.1016/s0304-3991(78)80032-1*
	*Martin, F.W. (1978) The signal-to-damage ratio for microscopy based on electron loss by high-energy ions. Ultramicroscopy, 3. 75-79 doi:10.1016/s0304-3991(78)80009-6*
	Hutchinson, T.E., Johnson, D.E., Mackenzie, A.P. (1978) Instrumentation for direct observation of frozen hydrated specimens in the electron microscope. Ultramicroscopy, 3. 315-324 doi:10.1016/s0304-3991(78)80041-2
	*Ipohorski, M. (1978) Electron microscopy in Latin America. Ultramicroscopy, 3. 97pp. doi:10.1016/s0304-3991(78)80012-6*

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Martin, J.L., Kubin, L.P. (1978) Discussion on the limitations of “in situ” deformation experiments in a high voltage electron microscope. Ultramicroscopy, 3. 215-226 doi:10.1016/s0304-3991(78)80028-x

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