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Lane, Ryan, de Boer, Pascal, Giepmans, Ben N.G., Hoogenboom, Jacob P. (2019) Integrated Array Tomography for High Throughput Electron Microscopy. Microscopy and Microanalysis, 25. 1038-1039 doi:10.1017/s1431927619005920

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Reference TypeJournal (article/letter/editorial)
TitleIntegrated Array Tomography for High Throughput Electron Microscopy
JournalMicroscopy and Microanalysis
AuthorsLane, RyanAuthor
de Boer, PascalAuthor
Giepmans, Ben N.G.Author
Hoogenboom, Jacob P.Author
Year2019 (August)Volume25
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927619005920Search in ResearchGate
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Mindat Ref. ID4886732Long-form Identifiermindat:1:5:4886732:2
GUID0
Full ReferenceLane, Ryan, de Boer, Pascal, Giepmans, Ben N.G., Hoogenboom, Jacob P. (2019) Integrated Array Tomography for High Throughput Electron Microscopy. Microscopy and Microanalysis, 25. 1038-1039 doi:10.1017/s1431927619005920
Plain TextLane, Ryan, de Boer, Pascal, Giepmans, Ben N.G., Hoogenboom, Jacob P. (2019) Integrated Array Tomography for High Throughput Electron Microscopy. Microscopy and Microanalysis, 25. 1038-1039 doi:10.1017/s1431927619005920
In(2019) Microscopy and Microanalysis Vol. 25. Cambridge University Press (CUP)

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Lane, Ryan, Vos, Yoram, de Boer, Pascal, Giepmans, Ben N.G., Hoogenboom, Jacob P. (2019) Use of Negative Bias Potential for High Throughput Array Tomography in an Integrated Light-Electron Microscope. Microscopy and Microanalysis, 25. 1050-1051 doi:10.1017/s1431927619005981
Lane, R., de Boer, P., Giepmans, B. N. G., Hoogenboom, J.P. (2018) Integrated Correlative Light Electron Microscopy for Automated Array Tomography. Microscopy and Microanalysis, 24. 372-373 doi:10.1017/s1431927618002350
Kievits, Arent J., Duinkerken, B.H. Peter, Fermie, Job, Lane, Ryan, Giepmans, Ben N.G., Hoogenboom, Jacob P. (2024) Optical STEM detection for scanning electron microscopy. Ultramicroscopy, 256. 113877 doi:10.1016/j.ultramic.2023.113877
de Boer, Pascal, Hoogenboom, Jacob P, Giepmans, Ben N G (2015) Correlated light and electron microscopy: ultrastructure lights up!. Nature Methods, 12 (6). 503-513 doi:10.1038/nmeth.3400
Kievits, Arent, Fermie, Job, Duinkerken, Peter, Lane, Ryan, Carroll, Elizabeth, Giepmans, Ben, Hoogenboom, Jacob (2022) Characterization and Optimization of OSTEM; A Novel Detection Method for Single- and Multi-Beam Scanning Electron Microscopy. Microscopy and Microanalysis, 28. 1458-1460 doi:10.1017/s143192762200592x
Lane, Ryan, Balkenende, Luuk, van Staalduine, Simon, Wolters, Anouk, Giepmans, Ben, Voortman, Lennard, Hoogenboom, Jacob (2021) Label-free fluorescence predictions from large-scale correlative light and electron microscopy data. Microscopy and Microanalysis, 27. 94-95 doi:10.1017/s1431927621000969
Lane, Ryan, Balkenende, Luuk, van Staalduine, Simon, Wolters, Anouk H. G., Giepmans, Ben N. G., Voortman, Lennard, Hoogenboom, Jacob (2022) Organelle Segmentation Facilitated by Correlative Light Microscopy Data. Microscopy and Microanalysis, 28. 1518-1520 doi:10.1017/s1431927622006110
Fermie, Job, Zuidema, Wilco, Šejnoha, Radim, Wolters, Anouk, Giepmans, Ben, Hoogenboom, Jacob, Kruit, Pieter (2021) High-throughput imaging of biological samples with Delmic's FAST-EM. Microscopy and Microanalysis, 27. 558-560 doi:10.1017/s1431927621002439
Vos, Yoram, Lane, Ryan I., Peddie, Chris J., Wolters, Anouk H.G., Hoogenboom, Jacob P. (2021) Retarding Field Integrated Fluorescence and Electron Microscope. Microscopy and Microanalysis, 27 (1) 109-120 doi:10.1017/s1431927620024745
Scotuzzi, Marijke, Kuipers, Jeroen, Wensveen, Dasha I., de Boer, Pascal, Hagen, Kees W., Hoogenboom, Jacob P., Giepmans, Ben N. G. (2017) Multi-color electron microscopy by element-guided identification of cells, organelles and molecules. Scientific Reports, 7. doi:10.1038/srep45970
Giepmans, Ben N. G., de Boer, Pascal, Sjollema, Klaas A., Kuipers, Jeroen, Wolters, Anouk G.H. (2016) Large-scale EM & Correlative Microscopy (Nanotomy & CLEM). Microscopy and Microanalysis, 22. 198-199 doi:10.1017/s1431927616001847
 
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