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Dahmen, Tim, Trampert, Patrick, Slusallek, Philipp (2018) Blob-based Algebraic Reconstruction Technique for Computed Laminography. Microscopy and Microanalysis, 24. 994-995 doi:10.1017/s1431927618005469

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Reference TypeJournal (article/letter/editorial)
TitleBlob-based Algebraic Reconstruction Technique for Computed Laminography
JournalMicroscopy and Microanalysis
AuthorsDahmen, TimAuthor
Trampert, PatrickAuthor
Slusallek, PhilippAuthor
Year2018 (August)Volume24
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927618005469Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4883348Long-form Identifiermindat:1:5:4883348:6
GUID0
Full ReferenceDahmen, Tim, Trampert, Patrick, Slusallek, Philipp (2018) Blob-based Algebraic Reconstruction Technique for Computed Laminography. Microscopy and Microanalysis, 24. 994-995 doi:10.1017/s1431927618005469
Plain TextDahmen, Tim, Trampert, Patrick, Slusallek, Philipp (2018) Blob-based Algebraic Reconstruction Technique for Computed Laminography. Microscopy and Microanalysis, 24. 994-995 doi:10.1017/s1431927618005469
In(2018) Microscopy and Microanalysis Vol. 24. Cambridge University Press (CUP)

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Trampert, Patrick, Schlabach, Sabine, Dahmen, Tim, Slusallek, Philipp (2018) Exemplar-Based Inpainting Based on Dictionary Learning for Sparse Scanning Electron Microscopy. Microscopy and Microanalysis, 24. 700-701 doi:10.1017/s1431927618003999
Trampert, Patrick, Dahmen, Tim, Slusallek, Philipp (2018) Fact or Fiction: Maximal Image Quality with Minimal Dwell Time. Microscopy and Microanalysis, 24. 480-481 doi:10.1017/s1431927618002891
Trampert, Patrick, Schlabach, Sabine, Dahmen, Tim, Slusallek, Philipp (2019) Deep Learning for Sparse Scanning Electron Microscopy. Microscopy and Microanalysis, 25. 158-159 doi:10.1017/s1431927619001521
Trampert, Patrick, Dahmen, Tim, Slusallek, Philipp (2019) Application of Missing Wedge Inpainting in Material Science. Microscopy and Microanalysis, 25. 440-441 doi:10.1017/s1431927619002939
Dahmen, Tim, Marsalek *, Lukas, Marniok *, Nico, Turoňová, Beata, Bogachev, Sviatoslav, Trampert, Patrick, Nickels, Stefan, Slusallek, Philipp (2015) Ettention: Building Blocks for Iterative Reconstruction Algorithms. Microscopy and Microanalysis, 21. 1601-1602 doi:10.1017/s1431927615008788
Trampert, Patrick, Chen, Delei, Bogachev, Sviatoslav, Dahmen, Tim, Slusallek, Philipp (2016) Dictionary-based Filling of the Missing Wedge in Electron Tomography. Microscopy and Microanalysis, 22. 554-555 doi:10.1017/s1431927616003627
Dahmen, Tim, de Jonge, Niels, Trampert, Patrick, Engstler, Michael, Pauly, Christoph, Mücklich, Frank, Slusallek, Philipp (2016) “Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy. Microscopy and Microanalysis, 22. 632-633 doi:10.1017/s1431927616004013
Trampert, Patrick, Bogachev, Sviatoslav, Marniok, Nico, Dahmen, Tim, Slusallek, Philipp (2015) Marker Detection in Electron Tomography: A Comparative Study. Microscopy and Microanalysis, 21 (6). 1591-1601 doi:10.1017/s1431927615015433
Trampert, Patrick, Bogachev, Sviatoslav, Dahmen, Tim, Slusallek, Philipp (2016) A Comparative Study of Three Marker Detection Algorithms in Electron Tomography. Microscopy and Microanalysis, 22. 1044-1045 doi:10.1017/s1431927616006061
Dahmen, Tim, Kohr, Holger, de Jonge, Niels, Slusallek, Philipp (2015) Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy. Microscopy and Microanalysis, 21. 2337-2338 doi:10.1017/s1431927615012465
Dahmen, Tim, Kohr, Holger, Lupini, Andrew R., Baudoin, Jean-Pierre, Kübel, Christian, Trampert, Patrick, Slusallek, Philipp, de Jonge, Niels (2016) Combined Tilt- and Focal-Series Tomography for HAADF-STEM. Microscopy Today, 24 (3). 26-31 doi:10.1017/s1551929516000328
 
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