Miao, Jianwei, Yang, Yongsoo, Zhou, Jihan, Tian, Xuezeng, Yang, Yao, Kim, Dennis S., Pryor, Alan, Ercius, Peter, Ophus, Colin, Scott, M. C., Chen, Chien-Chun, Theis, Wolfgang, Eisenbach, Markus, Kent, Paul R. C., Sabirianov, Renat F., Zeng, Hao (2018) Atomic Electron Tomography: Adding a New Dimension to See Single Atoms in Materials. Microscopy and Microanalysis, 24. 558-559 doi:10.1017/s1431927618003288
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Atomic Electron Tomography: Adding a New Dimension to See Single Atoms in Materials | ||
| Journal | Microscopy and Microanalysis | ||
| Authors | Miao, Jianwei | Author | |
| Yang, Yongsoo | Author | ||
| Zhou, Jihan | Author | ||
| Tian, Xuezeng | Author | ||
| Yang, Yao | Author | ||
| Kim, Dennis S. | Author | ||
| Pryor, Alan | Author | ||
| Ercius, Peter | Author | ||
| Ophus, Colin | Author | ||
| Scott, M. C. | Author | ||
| Chen, Chien-Chun | Author | ||
| Theis, Wolfgang | Author | ||
| Eisenbach, Markus | Author | ||
| Kent, Paul R. C. | Author | ||
| Sabirianov, Renat F. | Author | ||
| Zeng, Hao | Author | ||
| Year | 2018 (August) | Volume | 24 |
| Publisher | Cambridge University Press (CUP) | ||
| DOI | doi:10.1017/s1431927618003288Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4882903 | Long-form Identifier | mindat:1:5:4882903:0 |
| GUID | 0 | ||
| Full Reference | Miao, Jianwei, Yang, Yongsoo, Zhou, Jihan, Tian, Xuezeng, Yang, Yao, Kim, Dennis S., Pryor, Alan, Ercius, Peter, Ophus, Colin, Scott, M. C., Chen, Chien-Chun, Theis, Wolfgang, Eisenbach, Markus, Kent, Paul R. C., Sabirianov, Renat F., Zeng, Hao (2018) Atomic Electron Tomography: Adding a New Dimension to See Single Atoms in Materials. Microscopy and Microanalysis, 24. 558-559 doi:10.1017/s1431927618003288 | ||
| Plain Text | Miao, Jianwei, Yang, Yongsoo, Zhou, Jihan, Tian, Xuezeng, Yang, Yao, Kim, Dennis S., Pryor, Alan, Ercius, Peter, Ophus, Colin, Scott, M. C., Chen, Chien-Chun, Theis, Wolfgang, Eisenbach, Markus, Kent, Paul R. C., Sabirianov, Renat F., Zeng, Hao (2018) Atomic Electron Tomography: Adding a New Dimension to See Single Atoms in Materials. Microscopy and Microanalysis, 24. 558-559 doi:10.1017/s1431927618003288 | ||
| In | (2018) Microscopy and Microanalysis Vol. 24. Cambridge University Press (CUP) | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
