| Reference Type | Journal (article/letter/editorial) |
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| Title | Synthetic and natural Reference materials for EPMA, LA-ICPMS, LA-MC-ICPMS, SIMS, and Spectroscopic Microanalysis |
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| Journal | Microscopy and Microanalysis |
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| Authors | Hanchar, John M. | Author |
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| Year | 2017 (July) | Volume | 23 |
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| Publisher | Cambridge University Press (CUP) |
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| DOI | doi:10.1017/s1431927617003221Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 4879946 | Long-form Identifier | mindat:1:5:4879946:5 |
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|
| GUID | 0 |
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| Full Reference | Hanchar, John M. (2017) Synthetic and natural Reference materials for EPMA, LA-ICPMS, LA-MC-ICPMS, SIMS, and Spectroscopic Microanalysis. Microscopy and Microanalysis, 23. 508-509 doi:10.1017/s1431927617003221 |
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| Plain Text | Hanchar, John M. (2017) Synthetic and natural Reference materials for EPMA, LA-ICPMS, LA-MC-ICPMS, SIMS, and Spectroscopic Microanalysis. Microscopy and Microanalysis, 23. 508-509 doi:10.1017/s1431927617003221 |
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| In | (2017) Microscopy and Microanalysis Vol. 23. Cambridge University Press (CUP) |
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These are possibly similar items as determined by title/reference text matching only.
