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Suenaga, Kazu (2016) Single Atom Spectroscopy in Low-Dimensional Materials using Low-voltage STEM. Microscopy and Microanalysis, 22. 868-869 doi:10.1017/s1431927616005183

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Reference TypeJournal (article/letter/editorial)
TitleSingle Atom Spectroscopy in Low-Dimensional Materials using Low-voltage STEM
JournalMicroscopy and Microanalysis
AuthorsSuenaga, KazuAuthor
Year2016 (July)Volume22
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927616005183Search in ResearchGate
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Mindat Ref. ID4877321Long-form Identifiermindat:1:5:4877321:8
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Full ReferenceSuenaga, Kazu (2016) Single Atom Spectroscopy in Low-Dimensional Materials using Low-voltage STEM. Microscopy and Microanalysis, 22. 868-869 doi:10.1017/s1431927616005183
Plain TextSuenaga, Kazu (2016) Single Atom Spectroscopy in Low-Dimensional Materials using Low-voltage STEM. Microscopy and Microanalysis, 22. 868-869 doi:10.1017/s1431927616005183
In(2016) Microscopy and Microanalysis Vol. 22. Cambridge University Press (CUP)

See Also

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Suenaga, Kazu (2017) Low-Voltage TEM/STEM for Imaging and Spectroscopy of Low-Dimensional Materials. Microscopy and Microanalysis, 23. 458-459 doi:10.1017/s1431927617002975
Mukai, Masaki, Morishita, Shigeyuki, Sawada, Hidetaka, Suenaga, Kazu (2016) Ultra High Energy Resolution EELS Mapping using Aberration-corrected Low-voltage STEM Equipped with Monochromator. Microscopy and Microanalysis, 22. 962-963 doi:10.1017/s1431927616005651
Suenaga, Kazu (2020) In Situ Observation of Structural Changes in Low-dimensional Materials by Means of TEM and STEM. Microscopy and Microanalysis, 26. 88-89 doi:10.1017/s1431927620013343
Suenaga, Kazu, Tizei, Luiz H. G., Lin, Yung-Chang, Senga, Ryosuke (2016) Monochromated EELS to Probe the Local Optical Properties of Low-Dimensional Materials. Microscopy and Microanalysis, 22. 950-951 doi:10.1017/s1431927616005596
Senga, Ryosuke, Pichler, Thomas, Suenaga, Kazu (2018) Measurement of Optical Excitations in Low-Dimensional Materials by Using a Monochromated Electron Source. Microscopy and Microanalysis, 24. 1574-1575 doi:10.1017/s1431927618008358
Suenaga, K., Sasaki, T., Sawada, H. (2013) Low-Voltage TEM/STEM for Atomic Resolution Imaging and Spectroscopy. Microscopy and Microanalysis, 19. 1220-1221 doi:10.1017/s143192761300809x
Morishita, Shigeyuki, Mukai, Masaki, Suenaga, Kazu, Sawada, Hidetaka (2016) Improvement of TEM Spatial Resolution at Low Accelerating Voltages (15-30 kV) with Monochromator. Microscopy and Microanalysis, 22. 982-983 doi:10.1017/s1431927616005754
Morishita, Shigeyuki, Senga, Ryosuke, Lin, Yung-Chang, Sawada, Hidetaka, Suenaga, Kazu (2018) Highly Depth-sensitive TEM Imaging of Graphene by using Monochromatic Electron Source at Low Accelerating Voltage. Microscopy and Microanalysis, 24. 1610-1611 doi:10.1017/s143192761800853x
Sasaki, Takeo, Morishita, Shigeyuki, Kohno, Yuji, Mukai, Masaki, Kimoto, Koji, Suenaga, Kazu (2017) Performance of Low-kV Aberration-corrected STEM with Delta-corrector and CFEG in Ultrahigh Vacuum Environment. Microscopy and Microanalysis, 23. 468-469 doi:10.1017/s1431927617003026
Wuhrer, Richard, Moran, Ken (2016) Conditions for Low Voltage Microanalysis and X-ray Mapping. Microscopy and Microanalysis, 22. 406-407 doi:10.1017/s1431927616002889
R.F., Egerton (2015) Opportunities for Low-Voltage TEM/STEM. Microscopy and Microanalysis, 21. 349-350 doi:10.1017/s1431927615002548
 
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