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Rice, Katherine P., Chen, Yimeng, Prosa, Ty J., Larson, David J., Nowell, Matt, Stoykovich, Mark P. (2015) Techniques for Transmission EBSD Mapping of Atom Probe Specimens. Microscopy and Microanalysis, 21. 1677-1678 doi:10.1017/s1431927615009162

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Reference TypeJournal (article/letter/editorial)
TitleTechniques for Transmission EBSD Mapping of Atom Probe Specimens
JournalMicroscopy and Microanalysis
AuthorsRice, Katherine P.Author
Chen, YimengAuthor
Prosa, Ty J.Author
Larson, David J.Author
Nowell, MattAuthor
Stoykovich, Mark P.Author
Year2015 (August)Volume21
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927615009162Search in ResearchGate
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Mindat Ref. ID4873524Long-form Identifiermindat:1:5:4873524:5
GUID0
Full ReferenceRice, Katherine P., Chen, Yimeng, Prosa, Ty J., Larson, David J., Nowell, Matt, Stoykovich, Mark P. (2015) Techniques for Transmission EBSD Mapping of Atom Probe Specimens. Microscopy and Microanalysis, 21. 1677-1678 doi:10.1017/s1431927615009162
Plain TextRice, Katherine P., Chen, Yimeng, Prosa, Ty J., Larson, David J., Nowell, Matt, Stoykovich, Mark P. (2015) Techniques for Transmission EBSD Mapping of Atom Probe Specimens. Microscopy and Microanalysis, 21. 1677-1678 doi:10.1017/s1431927615009162
In(2015) Microscopy and Microanalysis Vol. 21. Cambridge University Press (CUP)

See Also

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Rice, Katherine P., Chen, Yimeng, Prosa, Ty J., Larson, David J. (2016) Implementing Transmission Electron Backscatter Diffraction for Atom Probe Tomography. Microscopy and Microanalysis, 22 (3). 583-588 doi:10.1017/s1431927616011296
Chen, Yimeng, Rice, Katherine P., Prosa, Ty J., Reinhard, David A., Geiser, Brian P., Nowell, Matt M., Wright, Stuart I. (2017) Automated Crystallographic Identification of Atom Probe's Ion Desorption Map. Microscopy and Microanalysis, 23. 662-663 doi:10.1017/s143192761700397x
Rice, Katherine P., Ulfig, Robert M., Chen, Yimeng, Prosa, Ty J., Larson, David J. (2018) Grain Boundary Analysis of Inconel 718 Using a Novel Atom Probe Design. Microscopy and Microanalysis, 24. 2212-2213 doi:10.1017/s1431927618011546
Prosa, Ty J., Reinhard, David A., Francois-Saint-Cyr, H.G., Martin, Isabelle, Rice, Katherine P., Chen, Yimeng, Larson, David J. (2017) Evolution of Atom Probe Data Collection Toward Optimized and Fully Automated Acquisition. Microscopy and Microanalysis, 23. 616-617 doi:10.1017/s1431927617003750
Ulfig, Robert M., Bunton, Joseph, Lenz, Dan, Chen, Yimeng, Rice, Katherine P., Prosa, Ty J., Clifton, Peter H., Larson, David J. (2019) Performance of Ultra-Violet Laser Pulsing with a Wire-Geometry, Moderately Focused Atom Probe System (EIKOS). Microscopy and Microanalysis, 25. 2550-2551 doi:10.1017/s1431927619013485
Geiser, Brian P., Reinhard, David, Bunton, Joseph, Larson, David, Ulfig, Robert, Rice, Katherine P., Martin, Isabelle, Chen, Yimeng, Prosa, Ty, Payne, Tim (2022) A Reconstruction Wizard for Electrostatic Reconstruction. Microscopy and Microanalysis, 28. 704-705 doi:10.1017/s1431927622003282
Ulfig, Robert M., Prosa, Ty J., Chen, Yimeng, Rice, Katherine P., Martin, Isabelle., Reinhard, David A., Gieser, Brian P., Oltman, Edward, Lenz, Dan R., Bunton, Joseph, Van Dyke, Michael, Kelly, Thomas F., Larson, David J. (2017) Hardware and Software Advances in Commercially Available Atom Probe Tomography Systems. Microscopy and Microanalysis, 23. 40-41 doi:10.1017/s1431927617000885
Chen, Yimeng, Geiser, Brian, Oltman, Ed, Rice, Katherine, Ulfig, Robert, Prosa, Ty (2020) Study of Correlative Evaporation and Ion Dissociation in Atom Probe Data. Microscopy and Microanalysis, 26. 2882 doi:10.1017/s1431927620023090
Rice, Katherine P., Keller, Robert R., Stoykovich, Mark P. (2015) Beam Broadening in Transmission EBSD. Microscopy Today, 23 (2). 32-37 doi:10.1017/s1551929515000048
Chen, Y., Rice, K.P., Prosa, T.J., Nowell, M.M., Wright, S.I. (2016) Correlative t-EBSD Tomography and Atom Probe Tomography Analysis. Microscopy and Microanalysis, 22. 682-683 doi:10.1017/s1431927616004268
Prosa, Ty J., Larson, David J. (2017) Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography. Microscopy and Microanalysis, 23 (2). 194-209 doi:10.1017/s1431927616012642
 
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