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Prosa, T.J., Geiser, B.P., Ulfig, R.M., Kelly, T.F., Larson, D.J. (2014) Measurement of Detection Efficiency in Atom Probe Tomography. Microscopy and Microanalysis, 20. 1160-1161 doi:10.1017/s1431927614007533

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Reference TypeJournal (article/letter/editorial)
TitleMeasurement of Detection Efficiency in Atom Probe Tomography
JournalMicroscopy and Microanalysis
AuthorsProsa, T.J.Author
Geiser, B.P.Author
Ulfig, R.M.Author
Kelly, T.F.Author
Larson, D.J.Author
Year2014 (August)Volume20
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927614007533Search in ResearchGate
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Mindat Ref. ID4868090Long-form Identifiermindat:1:5:4868090:9
GUID0
Full ReferenceProsa, T.J., Geiser, B.P., Ulfig, R.M., Kelly, T.F., Larson, D.J. (2014) Measurement of Detection Efficiency in Atom Probe Tomography. Microscopy and Microanalysis, 20. 1160-1161 doi:10.1017/s1431927614007533
Plain TextProsa, T.J., Geiser, B.P., Ulfig, R.M., Kelly, T.F., Larson, D.J. (2014) Measurement of Detection Efficiency in Atom Probe Tomography. Microscopy and Microanalysis, 20. 1160-1161 doi:10.1017/s1431927614007533
In(2014) Microscopy and Microanalysis Vol. 20. Cambridge University Press (CUP)

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Geiser, B.P., Larson, D.J., Prosa, T.J., Kelly, T.F., Ulfig, R.M. (2013) Using Spatial Distribution Maps to Estimate APT Efficiency. Microscopy and Microanalysis, 19. 1000-1001 doi:10.1017/s1431927613006995
Geiser, B.P., Larson, D.J., Prosa, T.J., Kelly, T.F. (2013) Progress in Planar Feature Spatial Reconstruction for Atom Probe Tomography. Microscopy and Microanalysis, 19. 936-937 doi:10.1017/s1431927613006673
Kelly, T.F., Bunton, J.H., Prosa, T.J., Ulfig, R.M., Clifton, P.H., Larson, D.J. (2012) Laser-Specimen Interactions in Atom Probe Tomography. Microscopy and Microanalysis, 18. 584-585 doi:10.1017/s1431927612004771
Larson, D.J., Prosa, T.J., Oltman, E., Reinhard, D.A., Geiser, B.P., Ulfig, R.M., Merkulov, A. (2018) A High Multiple Hits Correction Factor for Atom Probe Tomography. Microscopy and Microanalysis, 24. 1084-1085 doi:10.1017/s1431927618005901
Larson, D.J., Reinhard, D.A., Prosa, T.J., Olson, D., Lawrence, D., Clifton, P.H., Ulfig, R.M., Kelly, T.F., Smentkowski, V.S. (2012) Atom Probe Tomography Analysis of Grain Boundaries in CdTe. Microscopy and Microanalysis, 18. 928-929 doi:10.1017/s1431927612006496
Reinhard, D.A., Payne, T.R., Strennen, E.M., Oltman, E., Geiser, B.P., Sobering, G.S., Lenz, D.R., Mandt, J., Groth, G.A., Larson, D.J., Ulfig, R.M., Prosa, T.J. (2019) Atom Probe Tomography Productivity Enhancements. Microscopy and Microanalysis, 25. 522-523 doi:10.1017/s1431927619003349
Ulfig, R.M., Larson, D.J., Kelly, T.F., Clifton, P.H., Prosa, T.J., Lenz, D.R, Oltman, E.X. (2014) Performance Advances in LEAP systems. Microscopy and Microanalysis, 20. 1120-1121 doi:10.1017/s1431927614007338
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Larson, D.J., Reinhard, D.A., Prosa, T.J., Olson, D., Lawrence, D., Clifton, P.H., Ulfig, R.M., Martin, I., Kelly, T.F., Smentkowski, V.S., Gordon, L.M., Joester, D., Inoue, K. (2012) New Applications in Atom Probe Tomography. Microscopy and Microanalysis, 18. 926-927 doi:10.1017/s1431927612006484
Ulfig, R.M., Geiser, B.P., Prosa, T.J., Larson, D.J., Leroux, J., Dupont, B. (2013) Multi-Region Data Simulation for Detection Limit Investigations in IVAS™. Microscopy and Microanalysis, 19. 986-987 doi:10.1017/s1431927613006922
LARSON, D.J., GEISER, B.P., PROSA, T.J., GERSTL, S.S.A., REINHARD, D.A., KELLY, T.F. (2011) Improvements in planar feature reconstructions in atom probe tomography. Journal of Microscopy, 243 (1). 15-30 doi:10.1111/j.1365-2818.2010.03474.x
 
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