| Reference Type | Journal (article/letter/editorial) |
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| Title | The Contribution of Thermally Scattered Electrons to Atomic Resolution Elemental Maps |
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| Journal | Microscopy and Microanalysis |
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| Authors | Williams, R.E.A. | Author |
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| Forbes, B.D. | Author |
| D'Alfonso, A.J. | Author |
| Srinivasan, R. | Author |
| Klenov, D.O. | Author |
| Freitag, B. | Author |
| Fraser, H.L. | Author |
| Allen, L.J. | Author |
| McComb, D. | Author |
| Year | 2013 (August) | Volume | 19 |
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| Publisher | Cambridge University Press (CUP) |
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| DOI | doi:10.1017/s143192761300785xSearch in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 4863787 | Long-form Identifier | mindat:1:5:4863787:3 |
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|
| GUID | 0 |
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| Full Reference | Williams, R.E.A., Forbes, B.D., D'Alfonso, A.J., Srinivasan, R., Klenov, D.O., Freitag, B., Fraser, H.L., Allen, L.J., McComb, D. (2013) The Contribution of Thermally Scattered Electrons to Atomic Resolution Elemental Maps. Microscopy and Microanalysis, 19. 1172-1173 doi:10.1017/s143192761300785x |
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| Plain Text | Williams, R.E.A., Forbes, B.D., D'Alfonso, A.J., Srinivasan, R., Klenov, D.O., Freitag, B., Fraser, H.L., Allen, L.J., McComb, D. (2013) The Contribution of Thermally Scattered Electrons to Atomic Resolution Elemental Maps. Microscopy and Microanalysis, 19. 1172-1173 doi:10.1017/s143192761300785x |
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| In | (2013) Microscopy and Microanalysis Vol. 19. Cambridge University Press (CUP) |
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