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Sasaki, T., Sawada, H., Hosokawa, F., Kaneyama, T., Kondo, Y., Kimoto, K., Suenaga, K. (2012) Advantage of Cc/Cs-corrected Imaging in 30 kV Transmission Electron Microscopy. Microscopy and Microanalysis, 18. 1514-1515 doi:10.1017/s1431927612009427

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Reference TypeJournal (article/letter/editorial)
TitleAdvantage of Cc/Cs-corrected Imaging in 30 kV Transmission Electron Microscopy
JournalMicroscopy and Microanalysis
AuthorsSasaki, T.Author
Sawada, H.Author
Hosokawa, F.Author
Kaneyama, T.Author
Kondo, Y.Author
Kimoto, K.Author
Suenaga, K.Author
Year2012 (July)Volume18
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927612009427Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4860151Long-form Identifiermindat:1:5:4860151:3
GUID0
Full ReferenceSasaki, T., Sawada, H., Hosokawa, F., Kaneyama, T., Kondo, Y., Kimoto, K., Suenaga, K. (2012) Advantage of Cc/Cs-corrected Imaging in 30 kV Transmission Electron Microscopy. Microscopy and Microanalysis, 18. 1514-1515 doi:10.1017/s1431927612009427
Plain TextSasaki, T., Sawada, H., Hosokawa, F., Kaneyama, T., Kondo, Y., Kimoto, K., Suenaga, K. (2012) Advantage of Cc/Cs-corrected Imaging in 30 kV Transmission Electron Microscopy. Microscopy and Microanalysis, 18. 1514-1515 doi:10.1017/s1431927612009427
In(2012) Microscopy and Microanalysis Vol. 18. Cambridge University Press (CUP)

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Sawada, H, Hosokawa, F, Sasaki, T, Yuasa, S, Kawazoe, M, Terao, M, Kaneyama, T, Kondo, Y, Kimoto, K, Suenaga, K (2011) Development of 30-kV Cc/Cs Correction Tandem System. Microscopy and Microanalysis, 17. 1184-1185 doi:10.1017/s1431927611006799
Sasaki, T, Sawada, H, Hosokawa, F, Shimizu, Y, Nakamichi, T, Yuasa, S, Kawazoe, M, Kaneyama, T, Kondo, Y, Kimoto, K, Suenaga, K (2011) Performance and Application of Chromatic/Spherical Aberration-Corrected 30 kV Transmission Electron Microscope. Microscopy and Microanalysis, 17. 1530-1531 doi:10.1017/s143192761100852x
Sawada, H, Hosokawa, F, Sasaki, T, Yuasa, S, Kawazoe, M, Terao, M, Kaneyama, T, Kondo, Y, Kimoto, K, Suenaga, K (2010) Chromatic Aberration Correction by Combination Concave Lens. Microscopy and Microanalysis, 16. 116-117 doi:10.1017/s1431927610059507
Sasaki, T, Sawada, H, Nakamichi, T, Hosokawa, F, Omoto, K, Tomita, T, Kaneyama, T, Kondo, Y, Kimoto, K, Suenaga, K (2009) Performance of Low-voltage Electron Microscope with New Aberration Correction System and Cold Field Emission Gun. Microscopy and Microanalysis, 15. 1080-1081 doi:10.1017/s1431927609094057
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Sasaki, T., Sawada, H., Hosokawa, F., Kohno, Y., Tomita, T., Kaneyama, T., Kondo, Y., Kimoto, K., Sato, Y., Suenaga, K. (2010) Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun. Journal of Electron Microscopy, 59. doi:10.1093/jmicro/dfq027
Sawada, H, Hosokawa, F, Kaneyama, T, Tomita, T, Kondo, Y, Tanaka, T, Oshima, Y, Tanishiro, Y, Takayanagi, K, Sannomiya, T (2007) Development of Spherical Aberration Corrected 300kV FETEM. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607077069
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Tomita, T, Tanishiro, Y, Miyata, T, Sawada, H, Hosokawa, F, Kaneyama, T, Kondo, Y, Tanaka, T, Ohshima, Y, Yamamoto, N, Takayanagi, K (2009) Highly Stable 300kV Cold Field Emission Gun for 50pm Resolution Electron Microscopy. Microscopy and Microanalysis, 15. 1084-1085 doi:10.1017/s1431927609093908
Sawada, H., Tanishiro, Y., Ohashi, N., Tomita, T., Hosokawa, F., Kaneyama, T., Kondo, Y., Takayanagi, K. (2009) STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun. Journal of Electron Microscopy, 58 (6). 357-361 doi:10.1093/jmicro/dfp030
 
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