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Mara, N, Bhattacharyya, D, Dickerson, P, Hoagland, R, Misra, A (2009) TEM Characterization of Deformation and Failure Mechanisms in 40 nm and 5nm Cu/Nb Nanolayed Micro Compression Pillars. Microscopy and Microanalysis, 15. 352-353 doi:10.1017/s1431927609098596

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Reference TypeJournal (article/letter/editorial)
TitleTEM Characterization of Deformation and Failure Mechanisms in 40 nm and 5nm Cu/Nb Nanolayed Micro Compression Pillars
JournalMicroscopy and Microanalysis
AuthorsMara, NAuthor
Bhattacharyya, DAuthor
Dickerson, PAuthor
Hoagland, RAuthor
Misra, AAuthor
Year2009 (July)Volume15
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927609098596Search in ResearchGate
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Mindat Ref. ID4847876Long-form Identifiermindat:1:5:4847876:6
GUID0
Full ReferenceMara, N, Bhattacharyya, D, Dickerson, P, Hoagland, R, Misra, A (2009) TEM Characterization of Deformation and Failure Mechanisms in 40 nm and 5nm Cu/Nb Nanolayed Micro Compression Pillars. Microscopy and Microanalysis, 15. 352-353 doi:10.1017/s1431927609098596
Plain TextMara, N, Bhattacharyya, D, Dickerson, P, Hoagland, R, Misra, A (2009) TEM Characterization of Deformation and Failure Mechanisms in 40 nm and 5nm Cu/Nb Nanolayed Micro Compression Pillars. Microscopy and Microanalysis, 15. 352-353 doi:10.1017/s1431927609098596
In(2009) Microscopy and Microanalysis Vol. 15. Cambridge University Press (CUP)

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Bhattacharyya, D, Mara, N, Dickerson, P, Hoagland, R, Misra, A (2008) TEM Characterization of Nanoindentation in Nanoscale Metallic Multilayers. Microscopy and Microanalysis, 14. 412-413 doi:10.1017/s1431927608087278
Mara, N. A., Bhattacharyya, D., Dickerson, P., Hoagland, R. G., Misra, A. (2008) Deformability of ultrahigh strength 5nm Cu∕Nb nanolayered composites. Applied Physics Letters, 92 (23). 231901pp. doi:10.1063/1.2938921
Bhattacharyya, D., Mara, N.A., Dickerson, P., Hoagland, R.G., Misra, A. (2009) Transmission electron microscopy study of the deformation behavior of Cu/Nb and Cu/Ni nanoscale multilayers during nanoindentation. Journal of Materials Research, 24 (3) 1291-1302 doi:10.1557/jmr.2009.0147
Mara, Nathan A., Bhattacharyya, D., Dickerson, Patricia O., Hoagland, R.G., Misra, Amit (2009) Ultrahigh Strength and Ductility of Cu-Nb Nanolayered Composites. Materials Science Forum, 633. 647-653 doi:10.4028/www.scientific.net/msf.633-634.647
Zheng, S., Wang, J., Dickerson, R.M., Beyerlein, I.J., Mara, N.A. (2012) In-situ TEM study of deformation twinning in roll-bonded Cu/Nb nanolamellar metallic composites. Microscopy and Microanalysis, 18. 742-743 doi:10.1017/s1431927612005569
Bhattacharyya, D., Mara, N.A., Dickerson, P., Hoagland, R.G., Misra, A. (2010) A transmission electron microscopy study of the deformation behavior underneath nanoindents in nanoscale Al–TiN multilayered composites. Philosophical Magazine, 90 (13). 1711-1724 doi:10.1080/14786430903459691
Chen, Y., Li, N., Yadav, S.K., Liu, X.-Y., Baldwin, J. K., Hoagland, R. G., Wang, J., Mara, N. (2017) The Role of Bcc Mg/Nb Interfaces in Nanocomposite Deformation Observed via In-Situ Mechanical Testing in TEM. Microscopy and Microanalysis, 23. 754-755 doi:10.1017/s1431927617004433
Misra, A, Zhang, X, Dickerson, R (2005) Deformation Response of Bimodal Nanoscale Metallic Multilayers. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605502411
Mara, N.A., Misra, A., Hoagland, R.G., Sergueeva, A.V., Tamayo, T., Dickerson, P., Mukherjee, A.K. (2008) High-temperature mechanical behavior/microstructure correlation of Cu/Nb nanoscale multilayers. Materials Science and Engineering: A, 493. 274-282 doi:10.1016/j.msea.2007.08.089
Dickerson, R M, Dickerson, P O, Hanrahan, R J (2005) A TEM Study of Oxide Scale on U-6Nb. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605501600
Wang, N (2009) Characterization of Semiconductor Nanowires by HRTEM and In-Situ TEM. Microscopy and Microanalysis, 15. 1186-1187 doi:10.1017/s1431927609095221
 
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