Blech, Ilan A., Guyaux, J., Cooper, G. (1967) High Temperature Camera for X‐Ray Topography. Review of Scientific Instruments, 38 (5). 638-641 doi:10.1063/1.1720788

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Reference Type	Journal (article/letter/editorial)
Title	High Temperature Camera for X‐Ray Topography
Journal	Review of Scientific Instruments
Authors	Blech, Ilan A.		Author
	Guyaux, J.		Author
	Cooper, G.		Author
Year	1967 (May)	Volume	38
Issue	5
Publisher	AIP Publishing
DOI	doi:10.1063/1.1720788Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	4807707	Long-form Identifier	mindat:1:5:4807707:1
GUID	0
Full Reference	Blech, Ilan A., Guyaux, J., Cooper, G. (1967) High Temperature Camera for X‐Ray Topography. Review of Scientific Instruments, 38 (5). 638-641 doi:10.1063/1.1720788
Plain Text	Blech, Ilan A., Guyaux, J., Cooper, G. (1967) High Temperature Camera for X‐Ray Topography. Review of Scientific Instruments, 38 (5). 638-641 doi:10.1063/1.1720788
In	(1967, May) Review of Scientific Instruments Vol. 38 (5) AIP Publishing

	*Blech, Ilan A., Meieran, Eugene S. (1967) Erratum: High Temperature X‐Ray Topography of Si Wafers Strained by Thin Surface Films. Applied Physics Letters, 10 (2). 65 doi:10.1063/1.1754848*
	*Brumberger, H., Alexandropoulos, N. G. (1967) High‐Temperature Sample Cell for the Kratky Small‐Angle X‐Ray Camera. Review of Scientific Instruments, 38 (11). 1579-1580 doi:10.1063/1.1720606*
	*Carron, Gene J. (1967) X‐Ray Topographic Camera. Review of Scientific Instruments, 38 (5). 628-631 doi:10.1063/1.1720784*
	*Blech, Ilan A., Meieran, Eugene S. (1966) HIGH‐TEMPERATURE X‐RAY TOPOGRAPHY OF Si WAFERS STRAINED BY THIN SURFACE FILMS. Applied Physics Letters, 9 (6). 245-246 doi:10.1063/1.1754732*
	*Connell, L. F. (1947) High Temperature X‐Ray Diffraction Camera. Review of Scientific Instruments, 18 (5). 367 doi:10.1063/1.1740951*
	*Chesley, Frank G. (1946) High Temperature X‐Ray Diffraction Camera. Review of Scientific Instruments, 17 (12). 558 doi:10.1063/1.1770431*
	*Spencer, W. J., Brown, E. J. (1963) Camera for X‐Ray Diffraction Topography. Review of Scientific Instruments, 34 (12). 1420-1422 doi:10.1063/1.1718254*
	Yee, Kenneth W., Deslattes, Richard D. (1967) Transistorized Current Stabilizer for X‐Ray Tubes with Directly Heated Cathodes. Review of Scientific Instruments, 38 (5). 637-638 doi:10.1063/1.1720787
	Blech, Ilan A., Meieran, Eugene S. (1967) Enhanced X‐Ray Diffraction from Substrate Crystals Containing Discontinuous Surface Films. Journal of Applied Physics, 38 (7). 2913-2919 doi:10.1063/1.1710023
	*Wilkinson, J. D., Calvert, L. D. (1963) Direct Melting‐Point Calibration of a High‐Temperature X‐Ray Camera. Review of Scientific Instruments, 34 (5). 545-550 doi:10.1063/1.1718502*
	*Meieran, Eugene S., Blech, Ilan A. (1967) Stacking‐Fault Contrast in X‐Ray Topographs of Annealed Si Web Dendrite. Journal of Applied Physics, 38 (9). 3495-3508 doi:10.1063/1.1710160*

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Blech, Ilan A., Guyaux, J., Cooper, G. (1967) High Temperature Camera for X‐Ray Topography. Review of Scientific Instruments, 38 (5). 638-641 doi:10.1063/1.1720788

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