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Dubbink, David, Koster, Gertjan, Rijnders, Guus (2018) Growth mechanism of epitaxial YSZ on Si by Pulsed Laser Deposition. Scientific Reports, 8. doi:10.1038/s41598-018-24025-7

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Reference TypeJournal (article/letter/editorial)
TitleGrowth mechanism of epitaxial YSZ on Si by Pulsed Laser Deposition
JournalScientific Reports
AuthorsDubbink, DavidAuthor
Koster, GertjanAuthor
Rijnders, GuusAuthor
Year2018 (December)Volume8
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1038/s41598-018-24025-7Search in ResearchGate
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Mindat Ref. ID4740614Long-form Identifiermindat:1:5:4740614:2
GUID0
Full ReferenceDubbink, David, Koster, Gertjan, Rijnders, Guus (2018) Growth mechanism of epitaxial YSZ on Si by Pulsed Laser Deposition. Scientific Reports, 8. doi:10.1038/s41598-018-24025-7
Plain TextDubbink, David, Koster, Gertjan, Rijnders, Guus (2018) Growth mechanism of epitaxial YSZ on Si by Pulsed Laser Deposition. Scientific Reports, 8. doi:10.1038/s41598-018-24025-7
In(2018) Scientific Reports Vol. 8. Springer Science and Business Media LLC

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Blank, Dave H.A, Koster, Gertjan, Rijnders, Guus A.J.H.M, Eelco van Setten, , Slycke, Per, Rogalla, Horst (2000) Epitaxial growth of oxides with pulsed laser interval deposition. Journal of Crystal Growth, 211 (1). 98-105 doi:10.1016/s0022-0248(99)00880-5
Wang, Jun, Rijnders, Guus, Koster, Gertjan (2018) Complex plume stoichiometry during pulsed laser deposition of SrVO3 at low oxygen pressures. Applied Physics Letters, 113 (22). 223103pp. doi:10.1063/1.5049792
Koster, Gertjan, Rijnders, Guus J. H. M., Blank, Dave H. A., Rogalla, Horst (1999) Imposed layer-by-layer growth by pulsed laser interval deposition. Applied Physics Letters, 74 (24). 3729-3731 doi:10.1063/1.123235
Rijnders, Guus, Koster, Gertjan, Leca, Victor, Blank, Dave H.A., Rogalla, Horst (2000) Imposed layer-by-layer growth with pulsed laser interval deposition. Applied Surface Science, 168. 223-226 doi:10.1016/s0169-4332(00)00602-4
Blank, Dave H.A, Rijnders, Guus J.H.M, Koster, Gertjan, Rogalla, Horst (1999) In-situ monitoring by reflective high energy electron diffraction during pulsed laser deposition. Applied Surface Science, 138. 17-23 doi:10.1016/s0169-4332(98)00470-x
Blank, Dave H.A, Rijnders, Guus J.H.M, Koster, Gertjan, Rogalla, Horst (1998) In-situ monitoring during pulsed laser deposition using RHEED at high pressure. Applied Surface Science, 127. 633-638 doi:10.1016/s0169-4332(97)00717-4
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Vailionis, Arturas, Boschker, Hans, Houwman, Evert, Koster, Gertjan, Rijnders, Guus, Blank, Dave H. A. (2009) Anisotropic stress relief mechanism in epitaxial La0.67Sr0.33MnO3 films. Applied Physics Letters, 95 (15). 152508pp. doi:10.1063/1.3249583
Rijnders, Guus J. H. M., Koster, Gertjan, Blank, Dave H. A., Rogalla, Horst (1997) In situmonitoring during pulsed laser deposition of complex oxides using reflection high energy electron diffraction under high oxygen pressure. Applied Physics Letters, 70 (14). 1888-1890 doi:10.1063/1.118687
Li, Lin, Liao, Zhaoliang, Duc Nguyen, Minh, Hueting, Raymond J.E., Gravesteijn, Dirk J., Houwman, Evert P., Rijnders, Guus, Koster, Gertjan (2020) Epitaxial growth of full range of compositions of (1 1 1) PbZr1-Ti O3 on GaN. Journal of Crystal Growth, 538. 125620pp. doi:10.1016/j.jcrysgro.2020.125620
Antoja-Lleonart, Jordi, Zhou, Silang, de Hond, Kit, Huang, Sizhao, Koster, Gertjan, Rijnders, Guus, Noheda, Beatriz (2020) Atomic layer deposition of SiO2–GeO2 multilayers. Applied Physics Letters, 117 (4) 41601pp. doi:10.1063/5.0009844
 
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