| Reference Type | Journal (article/letter/editorial) |
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| Title | X-ray position-sensitive detectors |
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| Journal | Journal of Applied Crystallography |
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| Authors | Arndt, U. W. | Author |
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| Year | 1986 (June 1) | Volume | 19 |
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| Issue | 3 |
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| Publisher | International Union of Crystallography (IUCr) |
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| DOI | doi:10.1107/s0021889886089732Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 470700 | Long-form Identifier | mindat:1:5:470700:8 |
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| GUID | 0 |
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| Full Reference | Arndt, U. W. (1986) X-ray position-sensitive detectors. Journal of Applied Crystallography, 19 (3) 145-163 doi:10.1107/s0021889886089732 |
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| Plain Text | Arndt, U. W. (1986) X-ray position-sensitive detectors. Journal of Applied Crystallography, 19 (3) 145-163 doi:10.1107/s0021889886089732 |
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| In | (1986, June) Journal of Applied Crystallography Vol. 19 (3) International Union of Crystallography (IUCr) |
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| Abstract/Notes | The physical processes are examined which can be used for the detection of X-rays in the range between about 3 and about 20 keV and for the positional localization of the incident photons. The criteria for choosing a detector for particular purposes are discussed in general terms. Specific examples of one- and two-dimensional detectors are then considered with particular emphasis on devices which are still in a state of development, and an attempt is made to summarize the nature, performance and suitability for different experiments of available detectors. |
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