Reeke Jnr, G. N. (1984) Eigenvalue filtering in the refinement of crystal and orientation parameters for oscillation photography. Journal of Applied Crystallography, 17 (4) 238-243 doi:10.1107/s0021889884011444

| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Eigenvalue filtering in the refinement of crystal and orientation parameters for oscillation photography | ||
| Journal | Journal of Applied Crystallography | ||
| Authors | Reeke Jnr, G. N. | Author | |
| Year | 1984 (August 1) | Volume | 17 |
| Issue | 4 | ||
| Publisher | International Union of Crystallography (IUCr) | ||
| DOI | doi:10.1107/s0021889884011444Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 469934 | Long-form Identifier | mindat:1:5:469934:1 |
| GUID | 0 | ||
| Full Reference | Reeke Jnr, G. N. (1984) Eigenvalue filtering in the refinement of crystal and orientation parameters for oscillation photography. Journal of Applied Crystallography, 17 (4) 238-243 doi:10.1107/s0021889884011444 | ||
| Plain Text | Reeke Jnr, G. N. (1984) Eigenvalue filtering in the refinement of crystal and orientation parameters for oscillation photography. Journal of Applied Crystallography, 17 (4) 238-243 doi:10.1107/s0021889884011444 | ||
| In | (1984, August) Journal of Applied Crystallography Vol. 17 (4) International Union of Crystallography (IUCr) | ||
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