| Reference Type | Journal (article/letter/editorial) |
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| Title | Application of synchrotron radiation to anomalous scattering for structure analysis with a four-circle diffractometer |
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| Journal | Journal of Applied Crystallography |
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| Authors | Sakamaki, T. | Author |
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| Hosoya, S. | Author |
| Tagai, T. | Author |
| Ohsumi, K. | Author |
| Satow, Y. | Author |
| Year | 1984 (August 1) | Volume | 17 |
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| Issue | 4 |
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| Publisher | International Union of Crystallography (IUCr) |
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| DOI | doi:10.1107/s0021889884011419Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 469922 | Long-form Identifier | mindat:1:5:469922:8 |
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|
| GUID | 0 |
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| Full Reference | Sakamaki, T., Hosoya, S., Tagai, T., Ohsumi, K., Satow, Y. (1984) Application of synchrotron radiation to anomalous scattering for structure analysis with a four-circle diffractometer. Journal of Applied Crystallography, 17 (4) 219-225 doi:10.1107/s0021889884011419 |
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| Plain Text | Sakamaki, T., Hosoya, S., Tagai, T., Ohsumi, K., Satow, Y. (1984) Application of synchrotron radiation to anomalous scattering for structure analysis with a four-circle diffractometer. Journal of Applied Crystallography, 17 (4) 219-225 doi:10.1107/s0021889884011419 |
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| In | (1984, August) Journal of Applied Crystallography Vol. 17 (4) International Union of Crystallography (IUCr) |
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