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Dingley, David J., Wright, Stuart I. (2009) Determination of crystal phase from an electron backscatter diffraction pattern. Journal of Applied Crystallography, 42 (2). 234-241 doi:10.1107/s0021889809001654

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Reference TypeJournal (article/letter/editorial)
TitleDetermination of crystal phase from an electron backscatter diffraction pattern
JournalJournal of Applied Crystallography
AuthorsDingley, David J.Author
Wright, Stuart I.Author
Year2009 (April 1)Volume42
Issue2
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889809001654Search in ResearchGate
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Mindat Ref. ID4670607Long-form Identifiermindat:1:5:4670607:2
GUID0
Full ReferenceDingley, David J., Wright, Stuart I. (2009) Determination of crystal phase from an electron backscatter diffraction pattern. Journal of Applied Crystallography, 42 (2). 234-241 doi:10.1107/s0021889809001654
Plain TextDingley, David J., Wright, Stuart I. (2009) Determination of crystal phase from an electron backscatter diffraction pattern. Journal of Applied Crystallography, 42 (2). 234-241 doi:10.1107/s0021889809001654
In(2009, April) Journal of Applied Crystallography Vol. 42 (2) International Union of Crystallography (IUCr)

See Also

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Wright, SI, Dingley, DJ, Nowell, MM (2009) Determination of Crystal Structure from Electron Backscatter Diffraction Patterns. Microscopy and Microanalysis, 15. 766-767 doi:10.1017/s1431927609093714
Zambaldi, Claudio, Zaefferer, Stefan, Wright, Stuart I. (2009) Characterization of order domains in γ-TiAl by orientation microscopy based on electron backscatter diffraction. Journal of Applied Crystallography, 42 (6). 1092-1101 doi:10.1107/s0021889809036498
Dingley, D. J. (2002) Automated crystallographic phase identification using electron backscatter diffraction. Acta Crystallographica Section A Foundations of Crystallography, 58. doi:10.1107/s0108767302092383
Dingley, D. J. (1996) The determination and imaging of crystallographic texture using electron backscatter diffraction. Acta Crystallographica Section A Foundations of Crystallography, 52. doi:10.1107/s0108767396078750
Jackson, Brian, Fullwood, David, Christensen, Jordan, Wright, Stuart (2018) Resolving pseudosymmetry in γ-TiAl using cross-correlation electron backscatter diffraction with dynamically simulated reference patterns. Journal of Applied Crystallography, 51 (3). 655-669 doi:10.1107/s1600576718003849
Dingley, D J, Wright, S I, Nowell, M M (2005) Dynamic Background Correction of Electron Backscatter Diffraction Patterns. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605506676
Baba-Kishi, K. Z., Dingley, D. J. (1989) Application of backscatter Kikuchi diffraction in the scanning electron microscope to the study of NiS2. Journal of Applied Crystallography, 22 (3). 189-200 doi:10.1107/s0021889888013342
Engler, O. (2009) Comparison of X-ray and electron backscatter diffraction textures for back-annealed Al–Mg alloys. Journal of Applied Crystallography, 42 (6). 1147-1157 doi:10.1107/s0021889809041685
Li, Lili, Han, Ming (2015) Determining the Bravais lattice using a single electron backscatter diffraction pattern. Journal of Applied Crystallography, 48 (1). 107-115 doi:10.1107/s1600576714025989
Wright, Stuart I., Dingley, David J. (1998) Orientation Imaging in the Transmission Electron Microscope. Materials Science Forum, 273. 209-214 doi:10.4028/www.scientific.net/msf.273-275.209
Wright, Stuart I., Nowell, Matthew M., Field, David P. (2011) A Review of Strain Analysis Using Electron Backscatter Diffraction. Microscopy and Microanalysis, 17 (3). 316-329 doi:10.1017/s1431927611000055
 
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