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Chipera, Steve J., Bish, David L. (2002) FULLPAT: a full-pattern quantitative analysis program for X-ray powder diffraction using measured and calculated patterns. Journal of Applied Crystallography, 35 (6). 744-749 doi:10.1107/s0021889802017405

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Reference TypeJournal (article/letter/editorial)
TitleFULLPAT: a full-pattern quantitative analysis program for X-ray powder diffraction using measured and calculated patterns
JournalJournal of Applied Crystallography
AuthorsChipera, Steve J.Author
Bish, David L.Author
Year2002 (December 1)Volume35
Issue6
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889802017405Search in ResearchGate
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Mindat Ref. ID4667928Long-form Identifiermindat:1:5:4667928:2
GUID0
Full ReferenceChipera, Steve J., Bish, David L. (2002) FULLPAT: a full-pattern quantitative analysis program for X-ray powder diffraction using measured and calculated patterns. Journal of Applied Crystallography, 35 (6). 744-749 doi:10.1107/s0021889802017405
Plain TextChipera, Steve J., Bish, David L. (2002) FULLPAT: a full-pattern quantitative analysis program for X-ray powder diffraction using measured and calculated patterns. Journal of Applied Crystallography, 35 (6). 744-749 doi:10.1107/s0021889802017405
In(2002, December) Journal of Applied Crystallography Vol. 35 (6) International Union of Crystallography (IUCr)

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(2003) D117 Fullpat: A Full-Pattern Quantitative Analysis Program and Method for X-ray Powder Diffraction. Powder Diffraction, 18 (2) 181 doi:10.1154/1.1755159
Barr, Gordon, Gilmore, Christopher J., Paisley, Jonathan (2004) SNAP-1D: a computer program for qualitative and quantitative powder diffraction pattern analysis using the full pattern profile. Journal of Applied Crystallography, 37 (4). 665-668 doi:10.1107/s0021889804011847
Gilmore, Christopher J., Barr, Gordon, Paisley, Jonathan (2004) High-throughput powder diffraction. I. A new approach to qualitative and quantitative powder diffraction pattern analysis using full pattern profiles. Journal of Applied Crystallography, 37 (2). 231-242 doi:10.1107/s002188980400038x
Leonardi, Alberto, Bish, David L. (2016) High-performance powder diffraction pattern simulation for large-scale atomistic models via full-precision pair distribution function computation. Journal of Applied Crystallography, 49 (5). 1593-1608 doi:10.1107/s1600576716011729
Wiles, D. B., Young, R. A. (1981) A new computer program for Rietveld analysis of X-ray powder diffraction patterns. Journal of Applied Crystallography, 14 (2) 149-151 doi:10.1107/s0021889881008996
Feng, Zhen Jie, Dong, Cheng (2006) GENEFP: a full-profile fitting program for X-ray powder patterns using the genetic algorithm. Journal of Applied Crystallography, 39 (4). 615-617 doi:10.1107/s0021889806014154
Smith, D. K. (1984) Quantitative phase analysis using the whole X-ray powder diffraction pattern. Acta Crystallographica Section A Foundations of Crystallography, 40. doi:10.1107/s0108767384089340
(1987) Quantitative X-Ray Powder Diffraction Method Using the Full Diffraction Pattern. Powder Diffraction, 2 (2) 73-77 doi:10.1017/s0885715600012409
Wood, I. G., Nicholls, L., Brown, G. (1986) X-ray anomalous scattering difference patterns in qualitative and quantitative powder diffraction analysis. Journal of Applied Crystallography, 19 (5) 364-371 doi:10.1107/s0021889886089227
Mazumdar, Sujata (1999) A standardless method of quantitative ceramic analysis using X-ray powder diffraction. Journal of Applied Crystallography, 32 (3). 381-386 doi:10.1107/s0021889898012898
Davis, B. L., Spilde, M. N. (1990) Quantitative X-ray powder diffraction analysis applied to transmission diffraction. Journal of Applied Crystallography, 23 (4). 315-320 doi:10.1107/s0021889890003879
 
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