| Reference Type | Journal (article/letter/editorial) |
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| Title | The determination of the elastic constants of silicon by diffuse X-ray reflexions |
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| Journal | Acta Crystallographica |
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| Authors | Prasad, S. C. | Author |
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| Wooster, W. A. | Author |
| Year | 1955 (June 1) | Volume | 8 |
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| Issue | 6 |
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| Publisher | International Union of Crystallography (IUCr) |
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| DOI | doi:10.1107/s0365110x55001163 |
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| Generate Citation Formats |
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| Mindat Ref. ID | 466689 | Long-form Identifier | mindat:1:5:466689:3 |
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| GUID | 0 |
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| Full Reference | Prasad, S. C., Wooster, W. A. (1955) The determination of the elastic constants of silicon by diffuse X-ray reflexions. Acta Crystallographica, 8 (6) 361 doi:10.1107/s0365110x55001163 |
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| Plain Text | Prasad, S. C., Wooster, W. A. (1955) The determination of the elastic constants of silicon by diffuse X-ray reflexions. Acta Crystallographica, 8 (6) 361 doi:10.1107/s0365110x55001163 |
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| In | (1955, June) Acta Crystallographica Vol. 8 (6) International Union of Crystallography (IUCr) |
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These are possibly similar items as determined by title/reference text matching only.
