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Blessing, R. H., Coppens, P., Becker, P. (1974) Computer analysis of step-scanned X-ray data. Journal of Applied Crystallography, 7 (5) 488-492 doi:10.1107/s0021889874010259

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Reference TypeJournal (article/letter/editorial)
TitleComputer analysis of step-scanned X-ray data
JournalJournal of Applied Crystallography
AuthorsBlessing, R. H.Author
Coppens, P.Author
Becker, P.Author
Year1974 (October 1)Volume7
Issue5
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0021889874010259Search in ResearchGate
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Mindat Ref. ID464706Long-form Identifiermindat:1:5:464706:9
GUID0
Full ReferenceBlessing, R. H., Coppens, P., Becker, P. (1974) Computer analysis of step-scanned X-ray data. Journal of Applied Crystallography, 7 (5) 488-492 doi:10.1107/s0021889874010259
Plain TextBlessing, R. H., Coppens, P., Becker, P. (1974) Computer analysis of step-scanned X-ray data. Journal of Applied Crystallography, 7 (5) 488-492 doi:10.1107/s0021889874010259
In(1974, October) Journal of Applied Crystallography Vol. 7 (5) International Union of Crystallography (IUCr)

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Coppens, P., Ross, F. K., Blessing, R. H., Cooper, W. F., Larsen, F. K., Leipoldt, J. G., Rees, B. (1974) A cryostat for collection of three-dimensional diffractometer data at liquid helium temperatures. Journal of Applied Crystallography, 7 (3) 315-319 doi:10.1107/s0021889874009745
Rao, P., Goehner, R. P. (1974) Phase identification in the cobalt–samarium system with computer-simulated electron diffraction patterns. Journal of Applied Crystallography, 7 (5) 482-488 doi:10.1107/s0021889874010247
Coppens, P. (1974) Meeting Report. Journal of Applied Crystallography, 7 (2) 312-313 doi:10.1107/s002188987400968x
Becker, P., Bonse, U. (1974) The skew-symmetric two-crystal X-ray interferometer. Journal of Applied Crystallography, 7 (6) 593-598 doi:10.1107/s0021889874010491
Lecomte, C., Coppens, P., Blessing, R. H., Li, L. (1984) X-ray diffraction studies of the charge-density in porphyrins: mesotetraphenylporphinatobis(tetrahydrofuran)ironII. Acta Crystallographica Section A Foundations of Crystallography, 40. doi:10.1107/s0108767384094824
Wang, Y., Blessing, R. H., Ross, F. K., Coppens, P. (1976) Charge density studies below liquid nitrogen temperature: X-ray analysis of p-nitropyridine N-oxide at 30 K. Acta Crystallographica Section B Structural Crystallography and Crystal Chemistry, 32 (2) 572-578 doi:10.1107/s0567740876003439
Coppens, D. D., Coppens, P., Li, R., Lee, P. (1993) The use of carbon-composite cryostat chambers in low-temperature X-ray diffraction. Journal of Applied Crystallography, 26 (2). 226-228 doi:10.1107/s0021889892010677
King, P. J., Smith, W. L. (1974) A computer-controlled X-ray powder diffractometer. Journal of Applied Crystallography, 7 (6) 603-608 doi:10.1107/s002188987401051x
D'Antonio, P., Konnert, J. H. (1979) Computer program for radial distribution analysis of X-ray, neutron and electron diffraction data. Journal of Applied Crystallography, 12 (6) 634-635 doi:10.1107/s0021889879013534
Petricek, V., Coppens, P., Becker, P. (1985) Structure analysis of displacively modulated molecular crystals. Acta Crystallographica Section A Foundations of Crystallography, 41 (5). 478-483 doi:10.1107/s0108767385001027
White, M. A., Pressprich, M. R., Coppens, P., Coppens, D. D. (1994) Apparatus for the measurement of the electronic excited-state structure of single crystals using X-ray diffraction. Journal of Applied Crystallography, 27 (5). 727-732 doi:10.1107/s0021889894002724
 
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