| Reference Type | Journal (article/letter/editorial) |
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| Title | Skew-reflection X-ray microscopy of the vapor-growth surface of an Al2O single crystal |
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| Journal | Journal of Applied Crystallography |
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| Authors | Farabaugh, E. N. | Author |
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| Parker, H. S. | Author |
| Armstrong, R. W. | Author |
| Year | 1973 (December 1) | Volume | 6 |
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| Issue | 6 |
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| Publisher | International Union of Crystallography (IUCr) |
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| DOI | doi:10.1107/s0021889873009271Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 464147 | Long-form Identifier | mindat:1:5:464147:0 |
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| GUID | 0 |
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| Full Reference | Farabaugh, E. N., Parker, H. S., Armstrong, R. W. (1973) Skew-reflection X-ray microscopy of the vapor-growth surface of an Al2O single crystal. Journal of Applied Crystallography, 6 (6) 482-486 doi:10.1107/s0021889873009271 |
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| Plain Text | Farabaugh, E. N., Parker, H. S., Armstrong, R. W. (1973) Skew-reflection X-ray microscopy of the vapor-growth surface of an Al2O single crystal. Journal of Applied Crystallography, 6 (6) 482-486 doi:10.1107/s0021889873009271 |
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| In | (1973, December) Journal of Applied Crystallography Vol. 6 (6) International Union of Crystallography (IUCr) |
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