Houalla, Marwan, Delannay, Francis, Delmon, Bernard (1980) Joint studies by X-ray photoelectron spectroscopy and analytical electron microscopy of the dispersion of nickel oxide supported on silica and silica–aluminas. Journal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 76. 1766pp. doi:10.1039/f19807601766
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Joint studies by X-ray photoelectron spectroscopy and analytical electron microscopy of the dispersion of nickel oxide supported on silica and silica–aluminas | ||
| Journal | Journal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases | ||
| Authors | Houalla, Marwan | Author | |
| Delannay, Francis | Author | ||
| Delmon, Bernard | Author | ||
| Year | 1980 | Volume | 76 |
| Publisher | Royal Society of Chemistry (RSC) | ||
| DOI | doi:10.1039/f19807601766Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4523853 | Long-form Identifier | mindat:1:5:4523853:8 |
| GUID | 0 | ||
| Full Reference | Houalla, Marwan, Delannay, Francis, Delmon, Bernard (1980) Joint studies by X-ray photoelectron spectroscopy and analytical electron microscopy of the dispersion of nickel oxide supported on silica and silica–aluminas. Journal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 76. 1766pp. doi:10.1039/f19807601766 | ||
| Plain Text | Houalla, Marwan, Delannay, Francis, Delmon, Bernard (1980) Joint studies by X-ray photoelectron spectroscopy and analytical electron microscopy of the dispersion of nickel oxide supported on silica and silica–aluminas. Journal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 76. 1766pp. doi:10.1039/f19807601766 | ||
| In | (1980) Journal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases Vol. 76. Royal Society of Chemistry (RSC) | ||
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