Kobayashi, Ryota, Tatami, Junichi, Wakihara, Toru, Komeya, Katsutoshi, Meguro, Takeshi, Tu, Rong, Goto, Takashi (2010) Evaluation of Grain-Boundary Conduction of Dense AlN-SiC Solid Solution by Scanning Nonlinear Dielectric Microscopy. Journal of the American Ceramic Society, 93 (12). 4026-4029 doi:10.1111/j.1551-2916.2010.04230.x
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Evaluation of Grain-Boundary Conduction of Dense AlN-SiC Solid Solution by Scanning Nonlinear Dielectric Microscopy | ||
| Journal | Journal of the American Ceramic Society | ||
| Authors | Kobayashi, Ryota | Author | |
| Tatami, Junichi | Author | ||
| Wakihara, Toru | Author | ||
| Komeya, Katsutoshi | Author | ||
| Meguro, Takeshi | Author | ||
| Tu, Rong | Author | ||
| Goto, Takashi | Author | ||
| Year | 2010 (December) | Volume | 93 |
| Issue | 12 | ||
| Publisher | Wiley | ||
| DOI | doi:10.1111/j.1551-2916.2010.04230.xSearch in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4101017 | Long-form Identifier | mindat:1:5:4101017:4 |
| GUID | 0 | ||
| Full Reference | Kobayashi, Ryota, Tatami, Junichi, Wakihara, Toru, Komeya, Katsutoshi, Meguro, Takeshi, Tu, Rong, Goto, Takashi (2010) Evaluation of Grain-Boundary Conduction of Dense AlN-SiC Solid Solution by Scanning Nonlinear Dielectric Microscopy. Journal of the American Ceramic Society, 93 (12). 4026-4029 doi:10.1111/j.1551-2916.2010.04230.x | ||
| Plain Text | Kobayashi, Ryota, Tatami, Junichi, Wakihara, Toru, Komeya, Katsutoshi, Meguro, Takeshi, Tu, Rong, Goto, Takashi (2010) Evaluation of Grain-Boundary Conduction of Dense AlN-SiC Solid Solution by Scanning Nonlinear Dielectric Microscopy. Journal of the American Ceramic Society, 93 (12). 4026-4029 doi:10.1111/j.1551-2916.2010.04230.x | ||
| In | (2010, December) Journal of the American Ceramic Society Vol. 93 (12) Wiley | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
