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Lee, Hwan-Wen, Chu, Mike S. H., Lu, Hong-Yang (2009) Intragranular Voids and dc Degradation in (CaO+MgO) Codoped BaTiO3Multilayer Ceramic Capacitors. Journal of the American Ceramic Society, 92 (12). 3037-3043 doi:10.1111/j.1551-2916.2009.03311.x

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Reference TypeJournal (article/letter/editorial)
TitleIntragranular Voids and dc Degradation in (CaO+MgO) Codoped BaTiO3Multilayer Ceramic Capacitors
JournalJournal of the American Ceramic Society
AuthorsLee, Hwan-WenAuthor
Chu, Mike S. H.Author
Lu, Hong-YangAuthor
Year2009 (December)Volume92
Issue12
PublisherWiley
DOIdoi:10.1111/j.1551-2916.2009.03311.xSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID4100359Long-form Identifiermindat:1:5:4100359:0
GUID0
Full ReferenceLee, Hwan-Wen, Chu, Mike S. H., Lu, Hong-Yang (2009) Intragranular Voids and dc Degradation in (CaO+MgO) Codoped BaTiO3Multilayer Ceramic Capacitors. Journal of the American Ceramic Society, 92 (12). 3037-3043 doi:10.1111/j.1551-2916.2009.03311.x
Plain TextLee, Hwan-Wen, Chu, Mike S. H., Lu, Hong-Yang (2009) Intragranular Voids and dc Degradation in (CaO+MgO) Codoped BaTiO3Multilayer Ceramic Capacitors. Journal of the American Ceramic Society, 92 (12). 3037-3043 doi:10.1111/j.1551-2916.2009.03311.x
In(2009, December) Journal of the American Ceramic Society Vol. 92 (12) Wiley

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