Yavuz, Bulent O., Tressler, Richard E. (1993) Threshold Stress Intensity for Crack Growth in Silicon Carbide Ceramics. Journal of the American Ceramic Society, 76 (4). 1017-1024 doi:10.1111/j.1151-2916.1993.tb05329.x
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Threshold Stress Intensity for Crack Growth in Silicon Carbide Ceramics | ||
| Journal | Journal of the American Ceramic Society | ||
| Authors | Yavuz, Bulent O. | Author | |
| Tressler, Richard E. | Author | ||
| Year | 1993 (April) | Volume | 76 |
| Issue | 4 | ||
| Publisher | Wiley | ||
| DOI | doi:10.1111/j.1151-2916.1993.tb05329.xSearch in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4091207 | Long-form Identifier | mindat:1:5:4091207:9 |
| GUID | 0 | ||
| Full Reference | Yavuz, Bulent O., Tressler, Richard E. (1993) Threshold Stress Intensity for Crack Growth in Silicon Carbide Ceramics. Journal of the American Ceramic Society, 76 (4). 1017-1024 doi:10.1111/j.1151-2916.1993.tb05329.x | ||
| Plain Text | Yavuz, Bulent O., Tressler, Richard E. (1993) Threshold Stress Intensity for Crack Growth in Silicon Carbide Ceramics. Journal of the American Ceramic Society, 76 (4). 1017-1024 doi:10.1111/j.1151-2916.1993.tb05329.x | ||
| In | (1993, April) Journal of the American Ceramic Society Vol. 76 (4) Wiley | ||
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