Thompson, Robert J., Fearn, Sarah, Tan, Ke Jie, Cramer, Hans George, Kloc, Christian L., Curson, Neil J., Mitrofanov, Oleg (2013) Revealing surface oxidation on the organic semi-conducting single crystal rubrene with time of flight secondary ion mass spectroscopy. Physical Chemistry Chemical Physics, 15 (14). 5202pp. doi:10.1039/c3cp50310k

See Also

These are possibly similar items as determined by title/reference text matching only.

	Thompson, Robert J., Bennett, Thomas, Fearn, Sarah, Kamaludin, Muhammad, Kloc, Christian, McPhail, David S., Mitrofanov, Oleg, Curson, Neil J. (2016) Channels of oxygen diffusion in single crystal rubrene revealed. Physical Chemistry Chemical Physics, 18 (47). 32302-32307 doi:10.1039/c6cp05369f
	Thompson, R. J., Yadin, B., Grout, Z. J., Hudziak, S., Kloc, C. L., Mitrofanov, O., Curson, N. J. (2011) Evolution of the surface morphology of rubrene under ambient conditions. Applied Physics Letters, 98 (5). 53302pp. doi:10.1063/1.3551624
	Mitrofanov, Oleg, Lang, David V., Kloc, Christian, Wikberg, J. Magnus, Siegrist, Theo, So, Woo-Young, Sergent, M. A., Ramirez, Arthur P. (2006) Oxygen-Related Band Gap State in Single Crystal Rubrene. Physical Review Letters, 97 (16). doi:10.1103/physrevlett.97.166601
	Ma, Lin, Zhang, Keke, Kloc, Christian, Sun, Handong, Michel-Beyerle, Maria E., Gurzadyan, Gagik G. (2012) Singlet fission in rubrene single crystal: direct observation by femtosecond pump–probe spectroscopy. Physical Chemistry Chemical Physics, 14 (23). 8307pp. doi:10.1039/c2cp40449d
	Thompson, Patrick M. (1991) Quantitative surface analysis of organic polymer blends using a time-of-flight static secondary ion mass spectrometer. Analytical Chemistry, 63 (21). 2447-2456 doi:10.1021/ac00021a012
	Jiang, Hui, Tan, Ke Jie, Zhang, Keke K., Chen, Xiaodong, Kloc, Christian (2011) Ultrathin organic single crystals: fabrication, field-effect transistors and thickness dependence of charge carrier mobility. Journal of Materials Chemistry, 21. 4771pp. doi:10.1039/c0jm04383d
	Cotter, Robert J. (1984) Liquid secondary ion time-of-flight mass spectrometry. Analytical Chemistry, 56 (13). 2594-2596 doi:10.1021/ac00277a073
	Mitrofanov, Oleg, Kloc, Christian, Siegrist, Theo, Lang, David V., So, Woo-Young, Ramirez, Arthur P. (2007) Role of synthesis for oxygen defect incorporation in crystalline rubrene. Applied Physics Letters, 91 (21). 212106pp. doi:10.1063/1.2815939
	Hirata, K., Saitoh, Y., Chiba, A., Yamada, K., Takahashi, Y., Narumi, K. (2011) Secondary ion counting for surface-sensitive chemical analysis of organic compounds using time-of-flight secondary ion mass spectroscopy with cluster ion impact ionization. Review of Scientific Instruments, 82 (3). 33101pp. doi:10.1063/1.3541799
	Téllez, Helena, Aguadero, Ainara, Druce, John, Burriel, Mónica, Fearn, Sarah, Ishihara, Tatsumi, McPhail, David S., Kilner, John A. (2014) New perspectives in the surface analysis of energy materials by combined time-of-flight secondary ion mass spectrometry (ToF-SIMS) and high sensitivity low-energy ion scattering (HS-LEIS). Journal of Analytical Atomic Spectrometry, 29 (8). 1361pp. doi:10.1039/c3ja50292a
	Souda, Ryutaro (2006) Time-of-flight secondary ion mass spectroscopy analysis of Na adatoms interacting with water-ice film. The Journal of Chemical Physics, 125 (4). 44706pp. doi:10.1063/1.2216692