Fialin, M., Chopin, C. (2006) Electron-beam (5-10 keV) damage in triplite-group phosphates: Consequences for electron-microprobe analysis of fluorine. American Mineralogist, 91 (4) 503-510 doi:10.2138/am.2006.1926
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Electron-beam (5-10 keV) damage in triplite-group phosphates: Consequences for electron-microprobe analysis of fluorine | ||
Journal | American Mineralogist | ||
Authors | Fialin, M. | Author | |
Chopin, C. | Author | ||
Year | 2006 (April 1) | Volume | 91 |
Page(s) | 503-510 | Issue | 4 |
Publisher | Mineralogical Society of America | ||
DOI | doi:10.2138/am.2006.1926Search in ResearchGate | ||
Mindat Ref. ID | 395505 | Long-form Identifier | mindat:1:5:395505:9 |
GUID | e8d415a7-77d5-4baa-ada4-2275dfe50bbc | ||
Full Reference | Fialin, M., Chopin, C. (2006) Electron-beam (5-10 keV) damage in triplite-group phosphates: Consequences for electron-microprobe analysis of fluorine. American Mineralogist, 91 (4) 503-510 doi:10.2138/am.2006.1926 | ||
Plain Text | Fialin, M., Chopin, C. (2006) Electron-beam (5-10 keV) damage in triplite-group phosphates: Consequences for electron-microprobe analysis of fluorine. American Mineralogist, 91 (4) 503-510 doi:10.2138/am.2006.1926 | ||
In | (2006, April) American Mineralogist Vol. 91 (4) Mineralogical Society of America |
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