| Reference Type | Journal (article/letter/editorial) |
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| Title | Trace elements, crystal defects and high resolution electron microscopy |
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| Journal | Geochimica et Cosmochimica Acta |
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| Authors | Buseck, Peter R. | Author |
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| Veblen, David R. | Author |
| Year | 1978 (June) | Volume | 42 |
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| Issue | 6 |
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| Publisher | Elsevier BV |
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| DOI | doi:10.1016/0016-7037(78)90085-6Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 339145 | Long-form Identifier | mindat:1:5:339145:1 |
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| GUID | 0 |
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| Full Reference | Buseck, Peter R., Veblen, David R. (1978) Trace elements, crystal defects and high resolution electron microscopy. Geochimica et Cosmochimica Acta, 42 (6) 669-678 doi:10.1016/0016-7037(78)90085-6 |
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| Plain Text | Buseck, Peter R., Veblen, David R. (1978) Trace elements, crystal defects and high resolution electron microscopy. Geochimica et Cosmochimica Acta, 42 (6) 669-678 doi:10.1016/0016-7037(78)90085-6 |
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| In | (1978, June) Geochimica et Cosmochimica Acta Vol. 42 (6) Elsevier BV |
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