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Vala Ragnarsdottir, K., Graham, Colin M., Allen, Geoffrey C. (1996) Surface chemistry of reacted heulandite determined by SIMS and XPS. Chemical Geology, 131 (1) 167-181 doi:10.1016/0009-2541(96)00065-4

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Reference TypeJournal (article/letter/editorial)
TitleSurface chemistry of reacted heulandite determined by SIMS and XPS
JournalChemical Geology
AuthorsVala Ragnarsdottir, K.Author
Graham, Colin M.Author
Allen, Geoffrey C.Author
Year1996 (September)Volume131
Page(s)167-181Issue1
PublisherElsevier BV
DOIdoi:10.1016/0009-2541(96)00065-4Search in ResearchGate
Mindat Ref. ID289664Long-form Identifiermindat:1:5:289664:3
GUIDab61d3d4-a548-4461-a347-590b6056519b
Full ReferenceVala Ragnarsdottir, K., Graham, Colin M., Allen, Geoffrey C. (1996) Surface chemistry of reacted heulandite determined by SIMS and XPS. Chemical Geology, 131 (1) 167-181 doi:10.1016/0009-2541(96)00065-4
Plain TextVala Ragnarsdottir, K., Graham, Colin M., Allen, Geoffrey C. (1996) Surface chemistry of reacted heulandite determined by SIMS and XPS. Chemical Geology, 131 (1) 167-181 doi:10.1016/0009-2541(96)00065-4
In(1996, September) Chemical Geology Vol. 131 (1) Elsevier BV

References Listed

These are the references the publisher has listed as being connected to the article. Please check the article itself for the full list of references which may differ. Not all references are currently linkable within the Digital Library.

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