Kostiuk, Dmytro, Bodik, Michal, Siffalovic, Peter, Jergel, Matej, Halahovets, Yuriy, Hodas, Martin, Pelletta, Marco, Pelach, Michal, Hulman, Martin, Spitalsky, Zdenko, Omastova, Maria, Majkova, Eva (2016) Reliable determination of the few-layer graphene oxide thickness using Raman spectroscopy. Journal of Raman Spectroscopy, 47 (4). 391-394 doi:10.1002/jrs.4843

See Also

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	Bodik, Michal, Maxian, Ondrej, Hagara, Jakub, Nadazdy, Peter, Jergel, Matej, Majkova, Eva, Siffalovic, Peter (2020) Langmuir–Scheaffer Technique as a Method for Controlled Alignment of 1D Materials. Langmuir, 36 (16) 4540-4547 doi:10.1021/acs.langmuir.0c00045
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