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Zhang, Xingfan; Yoko, Akira; Zhou, Yi; Jee, Woongkyu; Mayoral, Alvaro; Liu, Taifeng; Guan, Jingcheng; Lu, You; Keal, Thomas W.; Buckeridge, John; et al. (2025) Surface-Driven Electron Localization and Defect Heterogeneity in Ceria. Journal of the American Chemical Society, 147 (37). doi:10.1021/jacs.5c10679

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Reference TypeJournal (article/letter/editorial)
TitleSurface-Driven Electron Localization and Defect Heterogeneity in Ceria
JournalJournal of the American Chemical Society
AuthorsZhang, XingfanAuthor
Yoko, AkiraAuthor
Zhou, YiAuthor
Jee, WoongkyuAuthor
Mayoral, AlvaroAuthor
Liu, TaifengAuthor
Guan, JingchengAuthor
Lu, YouAuthor
Keal, Thomas W.Author
Buckeridge, JohnAuthor
Ninomiya, KakeruAuthor
Nishibori, MaikoAuthor
Yamamoto, SusumuAuthor
Matsuda, IwaoAuthor
Adschiri, TadafumiAuthor
Terasaki, OsamuAuthor
Woodley, Scott M.Author
Catlow, C. Richard A.Author
Sokol, Alexey A.Author
Year2025 (September 17)Volume147
Issue37
PublisherAmerican Chemical Society (ACS)
DOIdoi:10.1021/jacs.5c10679Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID19024709Long-form Identifiermindat:1:5:19024709:8
GUID0
Full ReferenceZhang, Xingfan; Yoko, Akira; Zhou, Yi; Jee, Woongkyu; Mayoral, Alvaro; Liu, Taifeng; Guan, Jingcheng; Lu, You; Keal, Thomas W.; Buckeridge, John; et al. (2025) Surface-Driven Electron Localization and Defect Heterogeneity in Ceria. Journal of the American Chemical Society, 147 (37). doi:10.1021/jacs.5c10679
Plain TextZhang, Xingfan; Yoko, Akira; Zhou, Yi; Jee, Woongkyu; Mayoral, Alvaro; Liu, Taifeng; Guan, Jingcheng; Lu, You; Keal, Thomas W.; Buckeridge, John; et al. (2025) Surface-Driven Electron Localization and Defect Heterogeneity in Ceria. Journal of the American Chemical Society, 147 (37). doi:10.1021/jacs.5c10679
In(2025, September) Journal Of The American Chemical Society Vol. 147 (37). American Chemical Society (ACS)

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