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Gorman, Brian P, Kelly, Thomas F (2023) Comparing Methodologies for Achieving Atomic-Scale Tomography. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 596-597 doi:10.1093/micmic/ozad067.288

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Reference TypeJournal (article/letter/editorial)
TitleComparing Methodologies for Achieving Atomic-Scale Tomography
JournalMicroscopy and Microanalysis
AuthorsGorman, Brian PAuthor
Kelly, Thomas FAuthor
Year2023 (July 22)Volume29
PublisherOxford University Press (OUP)
DOIdoi:10.1093/micmic/ozad067.288Search in ResearchGate
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Mindat Ref. ID16637202Long-form Identifiermindat:1:5:16637202:1
GUID0
Full ReferenceGorman, Brian P, Kelly, Thomas F (2023) Comparing Methodologies for Achieving Atomic-Scale Tomography. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 596-597 doi:10.1093/micmic/ozad067.288
Plain TextGorman, Brian P, Kelly, Thomas F (2023) Comparing Methodologies for Achieving Atomic-Scale Tomography. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 596-597 doi:10.1093/micmic/ozad067.288
In(2023) Microscopy and Microanalysis Vol. 29. Cambridge University Press (CUP)

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Holtz, Megan E, Herzing, Andrew, Gorman, Brian (2023) Scanning Nanobeam Electron Diffraction for Atomic Scale Tomography. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 600-601 doi:10.1093/micmic/ozad067.290
Antonov, Stoichko, Kelly, Tom, Raabe, Dierk, Fraser, Hamish (2023) The Need for Atomic-scale Tomography. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 591-592 doi:10.1093/micmic/ozad067.285
Supple, Edwin, Gaspe, Chomani, Richardson, Christopher J K, Gorman, Brian P (2023) Towards Atomic Scale Tomography Using Correlative 4-D STEM, Strain Mapping, and Atom Probe Tomography. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 603-604 doi:10.1093/micmic/ozad067.292
Tiwary, Chandra Sekhar (2023) Engineering Materials at the Atomic Scale for Energy, Environment, and Healthcare Applications. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 20 doi:10.1093/micmic/ozad067.009
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Chao, Hsin-Yun (Joy), Chi, Miaofang (2023) Phase Modulation of CrCl3 using Atomic-scale Cryogenic STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1693 doi:10.1093/micmic/ozad067.871
Javier García de Abajo, F (2023) Free Electrons for Infrared Nanophotonics. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 643 doi:10.1093/micmic/ozad067.314
Simmons, Michelle Y (2023) Engineering Qubits in Silicon with Atomic Precision. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1362 doi:10.1093/micmic/ozad067.698
Beebe, Jeremy M (2023) Microscopy Methods for Analysis of Silicones. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 168 doi:10.1093/micmic/ozad067.075
He, Kai (2023) Reliable Microscopy and Microanalysis Strategies for Real-World Batteries. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 113-114 doi:10.1093/micmic/ozad067.049
 
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