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Castagna, Marc J, Klahn, Samuel (2023) Geometric Failures in the Preparation a STEM/TEM Sample with a FIB/SEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 426-427 doi:10.1093/micmic/ozad067.201

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Reference TypeJournal (article/letter/editorial)
TitleGeometric Failures in the Preparation a STEM/TEM Sample with a FIB/SEM
JournalMicroscopy and Microanalysis
AuthorsCastagna, Marc JAuthor
Klahn, SamuelAuthor
Year2023 (July 22)Volume29
PublisherOxford University Press (OUP)
DOIdoi:10.1093/micmic/ozad067.201Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID16637010Long-form Identifiermindat:1:5:16637010:2
GUID0
Full ReferenceCastagna, Marc J, Klahn, Samuel (2023) Geometric Failures in the Preparation a STEM/TEM Sample with a FIB/SEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 426-427 doi:10.1093/micmic/ozad067.201
Plain TextCastagna, Marc J, Klahn, Samuel (2023) Geometric Failures in the Preparation a STEM/TEM Sample with a FIB/SEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 426-427 doi:10.1093/micmic/ozad067.201
In(2023) Microscopy and Microanalysis Vol. 29. Cambridge University Press (CUP)

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Pang, Song (2023) Enhanced FIB-SEM Sample Preparation Methods and Pipeline for Comparative Biology. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1187 doi:10.1093/micmic/ozad067.611
Watt, John (2023) Investigating and Controlling Material Interfaces using Cryo-FIB/SEM and In-Situ TEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 657 doi:10.1093/micmic/ozad067.322
Naismith, James H (2023) Getting the Most Out of Your Sample from SEM for TEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1029 doi:10.1093/micmic/ozad067.522
Klie, Robert F (2023) Analytical Characterization of Functional Materials using Cryo-FIB/SEM and Aberration-corrected Cryo-STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1702-1703 doi:10.1093/micmic/ozad067.877
Kim, Daewon, Getachew, Bezawit A, Han, Yimo (2023) Generating Nanometer-sized Polymer Wires with SEM/FIB Instrumentation. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 543-544 doi:10.1093/micmic/ozad067.256
Goettler, D, Zhang, M (2023) Three-In-One Plan-View TEM Sample Preparation for 3D NAND. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 556-557 doi:10.1093/micmic/ozad067.264
Allen, Frances I (2023) FIB Milling with Alternative Beams for Microscopy and Microanalysis. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 501-502 doi:10.1093/micmic/ozad067.238
Xu, Shiyou (2023) Applications of SEM/FIB to Drive Development and Innovation in the Oral Care Industry. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1228-1229 doi:10.1093/micmic/ozad067.631
Zhang, Minghao (2023) Three-dimensional Imaging and Interface Analysis of Battery Materials via Plasma FIB-SEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 538 doi:10.1093/micmic/ozad067.253
Peet, Mathew, Henderson, Richard, Russo, Christopher (2023) Measuring Electron Dose Efficiency in TEM and STEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 1012 doi:10.1093/micmic/ozad067.509
Vitale, Suzy M, Sugar, Joshua D (2023) Lessons Learned from Failed TEM Sample Preparation Attempts Using a Focused Ion Beam. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 428-429 doi:10.1093/micmic/ozad067.202
 
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