Egerton, Ray, Hwang, Sooyeon, Zhu, Yimei (2023) Atomic-scale Secondary-electron Imaging in the STEM and SEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 452-453 doi:10.1093/micmic/ozad067.212
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Atomic-scale Secondary-electron Imaging in the STEM and SEM | ||
| Journal | Microscopy and Microanalysis | ||
| Authors | Egerton, Ray | Author | |
| Hwang, Sooyeon | Author | ||
| Zhu, Yimei | Author | ||
| Year | 2023 (July 22) | Volume | 29 |
| Publisher | Oxford University Press (OUP) | ||
| DOI | doi:10.1093/micmic/ozad067.212Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 16637003 | Long-form Identifier | mindat:1:5:16637003:4 |
| GUID | 0 | ||
| Full Reference | Egerton, Ray, Hwang, Sooyeon, Zhu, Yimei (2023) Atomic-scale Secondary-electron Imaging in the STEM and SEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 452-453 doi:10.1093/micmic/ozad067.212 | ||
| Plain Text | Egerton, Ray, Hwang, Sooyeon, Zhu, Yimei (2023) Atomic-scale Secondary-electron Imaging in the STEM and SEM. Microscopy and Microanalysis, 29. Oxford University Press (OUP) 452-453 doi:10.1093/micmic/ozad067.212 | ||
| In | (2023) Microscopy and Microanalysis Vol. 29. Cambridge University Press (CUP) | ||
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