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Bendavid, A., Martin, P. J., Netterfield, R. P., Sloggett, G. J., Kinder, T. J., Andrikidis, C. (1993) The deposition of niobium, NbN and Nb2O5 films by filtered arc evaporation. Journal of Materials Science Letters, 12 (5) 322-323 doi:10.1007/bf01910091

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Reference TypeJournal (article/letter/editorial)
TitleThe deposition of niobium, NbN and Nb2O5 films by filtered arc evaporation
JournalJournal of Materials Science Letters
AuthorsBendavid, A.Author
Martin, P. J.Author
Netterfield, R. P.Author
Sloggett, G. J.Author
Kinder, T. J.Author
Andrikidis, C.Author
Year1993 (March)Volume12
Issue5
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1007/bf01910091Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID16413770Long-form Identifiermindat:1:5:16413770:7
GUID0
Full ReferenceBendavid, A., Martin, P. J., Netterfield, R. P., Sloggett, G. J., Kinder, T. J., Andrikidis, C. (1993) The deposition of niobium, NbN and Nb2O5 films by filtered arc evaporation. Journal of Materials Science Letters, 12 (5) 322-323 doi:10.1007/bf01910091
Plain TextBendavid, A., Martin, P. J., Netterfield, R. P., Sloggett, G. J., Kinder, T. J., Andrikidis, C. (1993) The deposition of niobium, NbN and Nb2O5 films by filtered arc evaporation. Journal of Materials Science Letters, 12 (5) 322-323 doi:10.1007/bf01910091
In(1993, March) Journal of Materials Science Letters Vol. 12 (5) Springer Science and Business Media LLC

See Also

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Martin, P. J., Filipczuk, S. W., Netterfield, R. P., Field, J. S., Whitnall, D. F., McKenzie, D. R. (1988) Structure and hardness of diamond-like carbon films prepared by arc evaporation. Journal of Materials Science Letters, 7 (4) 410-412 doi:10.1007/bf01730760
Bendavid, A., Martin, P. J., Netterfield, R. P., Kinder, T. J. (1996) Characterization of the Optical Properties and Composition of TiNxThin Films by Spectroscopic Ellipsometry and X-ray Photoelectron Spectroscopy. Surface and Interface Analysis, 24 (9). 627-633 doi:10.1002/(sici)1096-9918(19960916)24:9<627::aid-sia149>3.0.co;2-r
Martin, P. J., Netterfield, R. P., Kinder, T. J., Stambouli, V. (1991) Insitustress measurements of ion‐assisted MgF2and SiOxthin films. Applied Physics Letters, 58 (22). 2497-2499 doi:10.1063/1.104855
Netterfield, R. P., Martin, P. J., McKenzie, D. R. (1990) Properties of ZrN x prepared by ion-assisted deposition. Journal of Materials Science Letters, 9 (8) 972-974 doi:10.1007/bf00722192
Martin, P. J., Bendavid, A., Comte, C., Miyata, H., Asao, Y., Ishida, Y., Sakai, A. (2007) Alignment and switching behaviors of liquid crystal on a-SiOx thin films deposited by a filtered cathodic arc process. Applied Physics Letters, 91 (6). 63516pp. doi:10.1063/1.2768308
Martin, P. J., Macleod, H. A., Netterfield, R. P., Pacey, C. G., Sainty, W. G. (1983) Ion-beam-assisted deposition of thin films. Applied Optics, 22. 178pp. doi:10.1364/ao.22.000178
Netterfield, R. P., Martin, P. J., Sainty, W. G. (1986) Synthesis of silicon nitride and silicon oxide films by ion-assisted deposition. Applied Optics, 25. 3808pp. doi:10.1364/ao.25.003808
Zhao, J. P., Wang, X., Shi, T. S., Liu, X. H. (1996) Evolution of the texture of TiN films prepared by filtered arc deposition. Journal of Applied Physics, 79 (12). 9399-9401 doi:10.1063/1.362576
Martin, P. J., Netterfield, R. P., Sainty, W. G., Clark, G. J., Lanford, W. A., Sie, S. H. (1983) Ion‐assisted deposition of bulklike ZrO2films. Applied Physics Letters, 43 (8). 711-713 doi:10.1063/1.94485
Martin, Philip, Netterfield, Roger, Kinder, Terry, Bendavid, Avi (1992) Optical properties and stress of ion-assisted aluminum nitride thin films. Applied Optics, 31. 6734pp. doi:10.1364/ao.31.006734
Beynon, J., Al-Ani, S. K. J., El-Samanoudy, M. M. A. G. (1993) The optical properties of Al x O y thin films prepared by reactive evaporation. Journal of Materials Science Letters, 12 (5) 308-310 doi:10.1007/bf01910086
 
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