Suzuki, M., Tashiro, M., Sato, G., Watanabe, S., Nakazawa, K., Takahashi, T., Okada, Y., Takahashi, H., Parsons, A., Barthelmy, S., Cummings, J., Gehrels, N., Hullinger, D., Krimm, H., Tueller, J. (2005) Hard X-ray response of CdZnTe detectors in the swift burst alert telescope. IEEE Transactions on Nuclear Science, 52 (4) 1033-1035 doi:10.1109/tns.2005.852968
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Hard X-ray response of CdZnTe detectors in the swift burst alert telescope | ||
| Journal | IEEE Transactions on Nuclear Science | ||
| Authors | Suzuki, M. | Author | |
| Tashiro, M. | Author | ||
| Sato, G. | Author | ||
| Watanabe, S. | Author | ||
| Nakazawa, K. | Author | ||
| Takahashi, T. | Author | ||
| Okada, Y. | Author | ||
| Takahashi, H. | Author | ||
| Parsons, A. | Author | ||
| Barthelmy, S. | Author | ||
| Cummings, J. | Author | ||
| Gehrels, N. | Author | ||
| Hullinger, D. | Author | ||
| Krimm, H. | Author | ||
| Tueller, J. | Author | ||
| Year | 2005 (August) | Volume | 52 |
| Issue | 4 | ||
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) | ||
| DOI | doi:10.1109/tns.2005.852968Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 15580243 | Long-form Identifier | mindat:1:5:15580243:0 |
| GUID | 0 | ||
| Full Reference | Suzuki, M., Tashiro, M., Sato, G., Watanabe, S., Nakazawa, K., Takahashi, T., Okada, Y., Takahashi, H., Parsons, A., Barthelmy, S., Cummings, J., Gehrels, N., Hullinger, D., Krimm, H., Tueller, J. (2005) Hard X-ray response of CdZnTe detectors in the swift burst alert telescope. IEEE Transactions on Nuclear Science, 52 (4) 1033-1035 doi:10.1109/tns.2005.852968 | ||
| Plain Text | Suzuki, M., Tashiro, M., Sato, G., Watanabe, S., Nakazawa, K., Takahashi, T., Okada, Y., Takahashi, H., Parsons, A., Barthelmy, S., Cummings, J., Gehrels, N., Hullinger, D., Krimm, H., Tueller, J. (2005) Hard X-ray response of CdZnTe detectors in the swift burst alert telescope. IEEE Transactions on Nuclear Science, 52 (4) 1033-1035 doi:10.1109/tns.2005.852968 | ||
| In | (2005) IEEE Transactions on Nuclear Science Vol. 52 (4) Institute of Electrical and Electronics Engineers (IEEE) | ||
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