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Dyer, C.S., Truscott, P.R., Evans, H.E., Peerless, C.L. (1996) Simulation of spacecraft secondary particle emissions and their energy deposition in CCD X-ray detectors. IEEE Transactions on Nuclear Science, 43 (6) 2709-2714 doi:10.1109/23.556857

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Reference TypeJournal (article/letter/editorial)
TitleSimulation of spacecraft secondary particle emissions and their energy deposition in CCD X-ray detectors
JournalIEEE Transactions on Nuclear Science
AuthorsDyer, C.S.Author
Truscott, P.R.Author
Evans, H.E.Author
Peerless, C.L.Author
Year1996 (December)Volume43
Issue6
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
DOIdoi:10.1109/23.556857Search in ResearchGate
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Mindat Ref. ID15575643Long-form Identifiermindat:1:5:15575643:6
GUID0
Full ReferenceDyer, C.S., Truscott, P.R., Evans, H.E., Peerless, C.L. (1996) Simulation of spacecraft secondary particle emissions and their energy deposition in CCD X-ray detectors. IEEE Transactions on Nuclear Science, 43 (6) 2709-2714 doi:10.1109/23.556857
Plain TextDyer, C.S., Truscott, P.R., Evans, H.E., Peerless, C.L. (1996) Simulation of spacecraft secondary particle emissions and their energy deposition in CCD X-ray detectors. IEEE Transactions on Nuclear Science, 43 (6) 2709-2714 doi:10.1109/23.556857
In(1996, December) IEEE Transactions on Nuclear Science Vol. 43 (6) Institute of Electrical and Electronics Engineers (IEEE)

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Truscott, P.R., Evans, H.E., Dyer, C.S., Peerless, C.L., Flatman, J.C., Cosby, M., Knight, P., Moss, C.E. (1996) Comparison of activation effects in /spl gamma/-ray detector materials. IEEE Transactions on Nuclear Science, 43 (3) 1510-1515 doi:10.1109/23.507094
Truscott, P.R., Evans, H.E., Dyer, C.S., Cosby, M., Knight, P.R., Moss, C.E. (1998) Monte Carlo simulation of induced radioactive background in gamma-ray detector materials. IEEE Transactions on Nuclear Science, 45 (3) 894-902 doi:10.1109/23.682657
Truscott, P.R., Dyer, C.S., Evans, H.E., Sims, A.J., Peerless, C.L., Knight, P.R., Cosby, M., Flatman, J.C., Comber, C., Hammond, N.D.A. (1998) Observations and predictions of secondary neutrons on space shuttle and aircraft. Advances in Space Research, 21. 1707-1716 doi:10.1016/s0273-1177(98)00057-x
Dyer, C.S., Truscott, P.R., Sims, A.J., Comber, C., Hammond, N.D.A. (1988) Particle transport simulation for spaceborne, NaI gamma-ray spectrometers. IEEE Transactions on Nuclear Science, 35 (6) 1407-1411 doi:10.1109/23.25472
Dyer, C.S., Truscott, P.R., Evans, H.E., Hammond, N., Comber, C., Battersby, S. (1994) Calculations and observations of induced radioactivity in spaceborne materials. IEEE Transactions on Nuclear Science, 41 (3) 438-444 doi:10.1109/23.299781
Sims, A.J., Dyer, C.S., Watson, C.J., Peerless, C.L. (1996) Measurements of the radiation environment on the APEX satellite. IEEE Transactions on Nuclear Science, 43 (3) 1061-1068 doi:10.1109/23.510756
Dyer, C.S., Truscott, P.R., Sanderson, C., Watson, C., Peerless, C.L., Knight, P., Mugford, R., Cousins, T., Noulty, R. (2000) Radiation environment measurements from CREAM and CREDO during the approach to solar maximum. IEEE Transactions on Nuclear Science, 47 (6) 2208-2217 doi:10.1109/23.903755
Truscott, P.R., Dyer, C.S., Haskins, P.S., McKisson, J.E. (1995) Activation of space-borne bismuth germanate /spl gamma/-ray detectors. IEEE Transactions on Nuclear Science, 42 (4) 946-955 doi:10.1109/23.467766
Dyer, C.S., Sims, A.J., Truscott, P.R., Peerless, C., Watson, C., Underwood, C. (1995) Measurement of the radiation environment from LEO to GTO using the CREAM and CREDO experiments. IEEE Transactions on Nuclear Science, 42 (6) 1975-1982 doi:10.1109/23.489242
Dyer, C.S., Truscott, P., Peerless, C.J., Watson, C.J., Evans, H.E., Knight, P., Cosby, M., Underwood, C., Cousins, T., Noulty, R. (1998) Updated measurements from CREAM and CREDO and implications for environment and shielding models. IEEE Transactions on Nuclear Science, 45 (3) 1584-1589 doi:10.1109/23.685244
Dyer, C.S., Comber, C., Truscott, P.R., Sanderson, C., Underwood, C., Oldfield, M., Campbell, A., Buchner, S., Meehan, T. (1999) Microdosimetry code simulation of charge-deposition spectra, single-event upsets and multiple-bit upsets. IEEE Transactions on Nuclear Science, 46 (6) 1486-1493 doi:10.1109/23.819112
 
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