Jackson, Thomas J., Cosh, Michael H., Bindlish, Rajat, Starks, Patrick J., Bosch, David D., Seyfried, Mark, Goodrich, David C., Moran, Mary Susan, Du, Jinyang (2010) Validation of Advanced Microwave Scanning Radiometer Soil Moisture Products. IEEE Transactions on Geoscience and Remote Sensing, 48 (12) 4256-4272 doi:10.1109/tgrs.2010.2051035
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Validation of Advanced Microwave Scanning Radiometer Soil Moisture Products | ||
| Journal | IEEE Transactions on Geoscience and Remote Sensing | ||
| Authors | Jackson, Thomas J. | Author | |
| Cosh, Michael H. | Author | ||
| Bindlish, Rajat | Author | ||
| Starks, Patrick J. | Author | ||
| Bosch, David D. | Author | ||
| Seyfried, Mark | Author | ||
| Goodrich, David C. | Author | ||
| Moran, Mary Susan | Author | ||
| Du, Jinyang | Author | ||
| Year | 2010 (December) | Volume | 48 |
| Issue | 12 | ||
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) | ||
| DOI | doi:10.1109/tgrs.2010.2051035Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 15548899 | Long-form Identifier | mindat:1:5:15548899:3 |
| GUID | 0 | ||
| Full Reference | Jackson, Thomas J., Cosh, Michael H., Bindlish, Rajat, Starks, Patrick J., Bosch, David D., Seyfried, Mark, Goodrich, David C., Moran, Mary Susan, Du, Jinyang (2010) Validation of Advanced Microwave Scanning Radiometer Soil Moisture Products. IEEE Transactions on Geoscience and Remote Sensing, 48 (12) 4256-4272 doi:10.1109/tgrs.2010.2051035 | ||
| Plain Text | Jackson, Thomas J., Cosh, Michael H., Bindlish, Rajat, Starks, Patrick J., Bosch, David D., Seyfried, Mark, Goodrich, David C., Moran, Mary Susan, Du, Jinyang (2010) Validation of Advanced Microwave Scanning Radiometer Soil Moisture Products. IEEE Transactions on Geoscience and Remote Sensing, 48 (12) 4256-4272 doi:10.1109/tgrs.2010.2051035 | ||
| In | (2010, December) IEEE Transactions on Geoscience and Remote Sensing Vol. 48 (12) Institute of Electrical and Electronics Engineers (IEEE) | ||
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